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AMO's proven and original technology for length and angle measurements uses techniques for scanning high precision graduations and consists of structures photo-lithographically etched onto steel. Based on this, inductive sensors with integrated evaluation electronics (in ASIC) have been developed further to create a new and powerful generation of measuring systems.

The AMOSIN^® length measuring systems are supplied in two principal versions: an open, non-contacting system, or as a guided, encapsulated system.

Operating entirely on an inductive basis, the AMOSIN^® systems achieve high precisions of up to +/- 5 μm/m, but are nevertheless able to resist environmental influences such as dust, humidity and are highly resistant to shock and vibration.

The high precision is mainly due to the procedure used to manufacture the rigid steel measuring tape, and to the exceptionally high quality sensor signal, with deviations in the sine wave down to < 0.1 % harmonic content, as a measure of the achievable interpolation precision within the grating pitch.

As will be seen from the measuring principle described below, the measuring system does not include any magnetic parts (neither in the measuring scale nor in the scanning head). As a result it is not at all sensitive to electromagnetic interference of any kind and has no hysteresis, in contrast to magnetic measuring systems.

The system's output interface is either 1 Vpp sine/cosine signals, or RS-422 square wave signals in real-time.

Properties - The New Generation:

• Analog output signals (1 Vpp) can also be delivered with a reduced signal period of 40 μm.
• Digital output RS-422 / TTL with decimal resolution: 0.25 μm (1000 μm/4000) and 1μm (1000 μm/1000).
• Introduction of the product group with a grating pitch of 3000 μm for high mounting tolerances.
• The standard working temperature range has been enlarged to 0-70 °C.
• Dependency of the precision of the system on the operating temperature has been significantly reduced.
• Scanning head clearance (air gap between the scanning head and the measuring tape) and its tolerance have been increased.
• The effects of mounting deviations within the specified tolerances on the precision of the system have been greatly reduced.
• Miniaturization of the evaluation electronics, permitting integration of this circuitry into the connector housing.