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Optical Test Chart...Sinusoidal MTF

Product Announcement from Applied Image Inc.

Optical Test Chart...Sinusoidal MTF -Image

Applied Image - Over twenty years ago, Dr. Robert Lamberts founded SINE Patterns on a single concept - to provide a new and better test array pattern for optical evaluations. After extensive research, Dr. Lamberts developed the first Sinusoidal Target Array Pattern, for which he later received a US Patent. Since then, SINE Patterns has expanded its product line to provide Sinusoidal Target Arrays for a variety of applications; from moiré contouring to reliable MTF evaluation of materials, lenses, cameras and electro-optical systems.

Mid-2004 SINE Patterns joined forces with APPLIED IMAGE, a world leader in PHOTONIC imaged components, to further strengthen its manufacturing and distribution channels. Today, SINE Patterns sinusoidal target arrays are available on transmission film or on reflective materials as well as in a variety of sizes and frequencies.

The transmission sinusoidal pattern arrays are made on extremely high resolution films. This makes it possible to achieve spatial frequencies as high as 256 cycles per mm. Most of SINE Patterns sinusoidal target transmission array patterns are available with modulation (contrast) values of 35%, 60% or 80%. Harmonic distortion of all of the sinusoidal target array patterns are less than 3%. The reflection sinusoidal pattern arrays are made on reflective materials. They have proven to be very useful for MTF evaluation of various types of cameras and scanners. Because of the inherent limitations of reflective materials, the maximum spatial frequency of the reflective pattern arrays is limited to 20 cycles per mm.