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Avantes is pleased to announce a partnership with Angstrom Sun Technologies of Acton, MA for the resale of their TFProbe multi-layer thin film software along with select thin film metrology systems for the UV/VIS and NIR.

The TFProbe® software from Angstrom Sun Technologies works with AvaSpec-USB2 spectrometers and is useful for multilayer thin film measurements.

The software measures film thickness and optical constants (N & K) up to 5 layers. TFprobe® is can be used for real time or in-line thickness, refractive index monitoring. The software package comes with a comprehensive optical constants database and library.

Also included is an advanced optical constants editor, which allows user to use either NK table, dispersion or effective media approximation (EMA) for each individual film or substrate.

For more information about TFProbe or Avantes complete solutions for thin film metrology, please contact a Sales Engineer at 1-866-678-4248 or infoUSA@avantes.com.