Data Logging (Error, History, Uniformity, Overlay, Focus, Session, and Wafer Logs)
SEMI-GEM E30/E37/E587 Host Link
Flexible software allows; quick modifications for custom applications, easy version upgrade (non prom-based)
BENEFITS
Increased throughput
Increased capacity; all levels NOW Automatic
Decreased setup time
- Mask and Wafer stages go to last setup position
- Parameter setting via download is faster than manual
entry
- Scan Arms are positioned automatically
Decreased Rework
Decreased mis-processing
- Process checking prior to processing
- Focus System eliminates hitting the wafer with nozzles with Smart Focus™
- Carriage Balance check to prevent banding
Decreased mis-alignment
- Tighter alignments on the tougher levels and fewer mis-alignments due to full field CCD
Decreased Downtime
Increased MTBF
- COTS components and fewer components
- Prealigner software prevents flexure breakage (similar to M700)
- Prealigner/IA feedback prevents wafer stage flexure breakage
- Actuator/Sensor failure reports help prevent catastrophic failures
- Joystick check at Process start to prevent lockup at Viewing
- Carriage Balance check to prevent overloading A201 PCB
Decreased Scheduled Downtime
- Mask Load position and uniformity hold flag software adjustable
- Focus Matrix & Adjustment (no calculations and/or mistakes)
- Overlay & Adjustment (no calculations and/or mistakes)
- Uniformity/Exposure Meter & Adjustment (no calculations and/or mistakes)
Increased MTBA
-Retries avoid assists from Operators
Decreased MTTR
-No more sequencer listing required when machine stops and doesn't say what's wrong
-Easier, faster repair & diagnostic procedures, (I/O screen with everything available, point and click)
Decreased Costs
- Lowered Repair Costs through use of COTS components
- Lowered training costs due to User-Friendly