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The Dimension V scanning probe microscope utilizes atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm in diameter. Its laser spot alignment system and the ability to change scanning techniques without tools guarantee flexibility, ease of use, and high product throughput.

The Dimension V incorporates the proven Dimension platform, the advanced, and the new NanoScope V controller, making it the preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation. The system's Hybrid XYZ scanner provides six times lower Z sensor noise, precise X/Y control for manipulation of molecules, and highly accurate three-axis closed-loop control for "pulling" techniques.

The system's new NanoScope V controller delivers reliable, high-speed data capture of high-pixel-density images (5120 x 5120) union allowing researchers to record and analyze tip-sample interactions that probe nanoscale events at timescales previously inaccessible to SPM. This state-of-the-art controller enables up to eight images to be simultaneously displayed/captured, offers outstanding software functionality and compatibility, and features Easy-AFM an intuitive, easy-to-follow graphic user interface for new or infrequent SPM users that streamlines every step of instrument operation.