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Rapidly examine alloys for metallurgical analysis, quality control, and failure analysis

The properties of many engineering materials are governed by a combination of metal composition and the morphology and distribution of key micro-structural features. These features can be observed with light microscopes, but when higher magnification and 3D detail is required, a scanning electron microscope (SEM) works best. The Phenom™ personal electron microscope exceeds the resolution of light microscopes (30 nm vs. 200 nm) and eliminates the expense, delay, and difficulty of operating a conventional SEM.

Application Briefs:

Metallurgical applications:Controlling the composition, morphology, and distribution of micro-structural features requires engineers to see beyond the power of light. Phenom is the right tool for the job.

Microscopic investigation with a metallurgical mount: Embedding and polishing techniques create flat samples embedded in a resin for microscopic investigation. Learn how the Phenom metallurgical mount holder supports these samples.

Watch or download a growing set of video clips on application methods, system usage and product overviews

FEI Phenom Tech Articles:

• Applications for Desktop SEMsContinue to Multiply (.pdf)
• Closing the Imaging Gap Between Optical and Electron Microscopy
• Developments in Scanning Electron Microscopy for Tablet and Granule Characterization
• Fiber Classification With The Phenom (.pdf)
• Phenom Imaging By Backscattered Electron Detection (.pdf)
• World's Smallest Electron Microscope (for Less than a Bimmer!)
• Phenom Use for Pharmaceutical Inspection (.pdf)