Product Announcement from Fischer Technology, Inc.


Element Identification with XRF-Image

Precious metals are the basis for jewelry production; however, they are also often used in high-tech industries such as electronics and medicine. The product cycle for precious metals ranges from the extraction of raw materials in mines via specific and at times very complex processing techniques all the way to recycling. Highest purity of the base metals, precise alloying and control of trace and minor elements are the basis of all precious metal products.

X-Ray fluorescence is a highly effective tool for materials analysis and coating thickness measurement. It is widely used for coating thickness measurement as well as element identification. The samples can be evaluated in almost any dimension and condition; powder, paste, liquid and solids are analyzed in the same manner. XRF gives fast results for WEEE and RoHS compliance testing.

The FISCHERSCOPE® X-Ray series are energy dispersive high-performance x-ray fluorescence (EDXRF) spectrometers and provide simple, fast and accurate analysis of unknown materials. Element detection from Aluminum to Uranium is possible even at very low concentrations. Below are typical fields of application:

· Material analysis of thin film coatings

· Trace analysis of harmful substances

· Materials analysis and coating thickness measurement

· Determination of lead for high reliability applications

· Analysis of hard coatings

· Gold and precious metal analysis

· RoHS and WEEE compliance testing

FISCHER can offer you the right solution for precise and reliable measurements in all these areas.

 
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