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Fischer Technology, Inc. / Coating Thickness Gages - FISCHERSCOPE® Conti 5000 for the solar industry
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The FISCHERSCOPE® X-RAY Conti 5000 instruments are innovative energy dispersive x-ray fluorescence spectrometers (EDXRF) for in-line process control. They are designed for continuous non-destructive analysis of alloys and measurement of thin layers and layer systems.
The Conti 5000 series is best suited for the photo voltaic industry to measure CIGS, CIS, CdTe in thickness and composition. The measurement of the photo active layers is possible on various substrates like glass panels, thin metal or plastic foils.
For each application the x-ray source and the semiconductor detector can be customized for best results. For simple integration into production lines the Conti 5000 comes with a standardized mounting flange. Various modular build versions are available to measure in vacuum or ambient air. Very hot substrates with surface temperatures of up to 500°C can be measured with an additional cooling flange.
Calibration is quick and easy with a master-piece directly in the production process. Due to a large aperture, state of the art semiconductor detectors and a digital pulse processor the Conti 5000 features an outstanding repeatability combined with an excellent longtime stability. The necessity for re-calibration is dramatically reduced, saving time and effort.
The entire operation, the analysis of the measurement signals and the display of all information, is carried out by an evaluation PC with the easy to use WinFTM® software. Due to a versatile communication interface, all Conti 5000 are easily integrated into industrial process control systems.
Contact:
Fischer Technology, Inc.
750 Marshall Phelps Rd
Windsor, CT 06095
Phone: 860-683-0781
Sales: 860-298-6060
Fax: 860-298-6090
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