Product Announcement from Fischer Technology, Inc.


FISCHERSCOPE® X-RAY XDV®-SDD-Image

Features

  • Premium model with universal application characteristics
  • Highest excitation flexibility, for both the size of the measurement spot and the spectral composition
  • With the silicon drift detector, even very high intensities
    > 100 kcps can be processed without a loss in energy resolution
  • Very low detection limits and excellent repeatability
  • Large and easily accessible measurement chamber
  • Automated series testing with fast, programmable XY-stage

Typical fields of application

  • Inspection of very thin coatings, e.g. in the electronics and semiconductor industries
  • Trace analysis, e. g. detection of harmful substances, according to RoHS, toy standards, packaging standards
  • Gold and precious metal analysis with highest precision
  • Photovoltaic industry
  • Measurement of thickness and composition of NiP-layers
 
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