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The Fischer X-Ray fluorescence material analysis instruments FISCHERSCOPE® X-RAY XAN® and XDAL® identify the content of prohibited metals in compliance to the EU directive RoHS/WEEE. These X-ray systems provide direct results of the concentrations for lead (Pb,) mercury (Hg), hexavalent chromium (Cr,VI), polyborominated diphenyl ethers (PBE), and Cd.

The FISCHERSCOPE XAN and XDAL instruments offer non-destructive, fast, reliable and easy to understand results. Hardware comes in devices that measure from bottom to top of the specimen or vice versa. Programmable XY measuring stages are available to accommodate many parts. Regardless of the system, Fischer X-Ray instruments provide the user the ability to immediately identify by means of a red colored warning if the concentration of the prohibited substance exceeds the allowed threshold.

The FISCHERSCOPE XAN and XDAL verify the reliability of electronics through material analysis and coating thickness measurement. These units are capable of analyzing multi-layer electronic components such as SnPb/Ni/Ag-Pb/Pb-Ceramic and general material testing analysis of plating bath solutions.

For more information contact Fischer Technology, Inc., 750 Marshall Phelps Rd., Windsor, CT 06095. 1-800-243-8417. In CT (860) 683-0781. FAX: (860) 688-8496. E-mail: info@fischer-technology.com. Web site: www.fischer-technology.com

Fischer has been an innovative leader in the field of non-destructive thickness measurement and material testing instruments since 1953. Solutions are available for coating thickness measurement using the X-Ray fluorescence, beta backscatter, magnetic induction, eddy current and coulometric methods. Fischer also offers solutions for measurement of micro-hardness, conductivity, ferrite content and porosity testing.