Product Announcement from Hiden Analytical


EQP - for advanced plasma process analysis-Image

Applications:

  • Analysis of positive ions, negative ions, neutral radicals and neutrals.
  • Etching / Deposition Studies.
  • Ion implantation / Laser Ablation.
  • Residual Gas Analysis / Leak Detection.
  • Plasma electrode coupling - follow electrode conditions during operation.
  • Analysis through a viewport, grounded electrode, driven electrode.

Features:

  • Software controlled Ion Extraction Optics for minimum plasma perturbation.
  • 45° Electrostatic Sector analyser, Scan Energy at 0.05 eV increments/ 0.25eV FWHM.
  • Minimum perturbation of ion flight path & constant ion transmission at all energies.
  • Differentially pumped Triple filter Quadrupole, mass range options to 2500amu.
  • High Sensitivity / Stability Pulse Ion Counting Detector with 7 decade dynamic range.
  • Tuneable integral ioniser for appearance potential MS with electron attachment option.
  • Penning Gauge and interlocks to provide over pressure protection.
  • Signal gating and programmable signal gating option for time resolved studies in pulsed plasma.
  • 1000eV Option, Floating option up to 10keV, Faraday Cup for high density plasmas.
  • Mu-Metal, Radio-metal shielding options, high pressure operation option.
  • MASsoft control via RS232, RS485 or Ethernet LAN.
 
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