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The new Jasco FT/IR-6100, FT/IR-6200, and FT/IR-6300 offer the absolute highest level of performance in the industry with the highest signal-to-noise specifications. Designed for a wide range of critical research and development applications, each model is capable of measuring from the Near IR (15000 cm-1) to the Far IR (50 cm-1).

The FT/IR-6300 is equipped with gold optical surfaces for more efficient FT-Raman analysis and rapid scan capability as standard. Step scan, high resolution, and full vacuum options are available for all models.

FT/IR-6100

· Max resolution: 0.5 cm-1 · S/N ratio: 42,000:1

The FT/IR-6100 provides a high level of functionality and high accuracy measurement capability at a reasonable price.

FT/IR-6200

· Max resolution: 0. 25 cm-1 · S/N ratio: 45,000:1

The FT/IR-6200, with a higher level of resolution offers an excellent choice for gas analysis and other critical applications such as measurement of impurities in semiconductor processing.

FT/IR-6300

· Max resolution: 0.07 cm-1 · S/N ratio: 50,000:1

The FT/IR-6300 features the absolute highest resolution, and signal-to-noise ratio in the industry. The gold coated optical surfaces provides higher throughput in the Near-IR region and enables expansion to FT-Raman measurement. The FT/IR-6300 includes the Rapid Scan (20 Hz) feature as standard for tracking high speed chemical reactions and other processes.

Performance and Flexibility Options... Design the Perfect System for Your Application and Expand as Required

Wave Number Extension The working range of any Jasco FT-IR can be extended to cover Near to Far-IR applications by switching various optical components, i.e., light source, beam splitters, and detector.

Rapid Scan The Rapid Scan function is optional for the FT/IR-4100, FT/IR-4200, FT/IR-6100, and FT/IR-6200 and provided as a standard feature of the FT/IR-6300. The Rapid Scan system enables the instrument to perform up to 20 scans per second for the FT/IR-6100/6200/6300 and 10 scans per second for the FT/IR-4100/4200 providing real-time analysis of reaction kinetics.

Step Scan (FT/IR-6000 Series only) Step Scan FT-IR spectroscopy offers the capability to obtain rapid time-resolved infrared measurements. This technique covers the entire mid-IR region allowing simultaneous measurement at all frequencies while maintaining the high throughput and multiplex advantages of FT-IR. The time-resolved Step Scan FT-IR technique involves displacing the moveable mirror of the interferometer in a step-wise manner. Using the Step Scan technique it is possible to monitor the progress of very fast and reproducible events.

Microscope/IR Imaging Jasco offers two infrared microscope models which can be easily interfaced to any FT/IR-4000 or FT/IR-6000 instrument. When used with the FT/IR-6000 the IMV-4000 multi-channel infrared microscope offers advanced capability for applications such as time-resolved imaging.

IQ Accessory Recognition IQ Accessory Recognition automatically recognizes the sampling accessory when inserted into the instrument sample compartment, using the previously declared instrument parameters for spectral data acquisition. The IQ System can be programmed for any commercially available sampling accessory.