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New Showroom Open, No Appointment Necessary

New Showroom Open, No Appointment Necessary

In time for SEMICON WEST 2008, Kikusui would like to announce the opening of our new showroom.

The showroom is just 5 minutes south from San Francisco Airport.

Showing and demonstrating our best line up including the latest new model, PLZ6000R (regenerative DC e-load).

For those who will be visiting SEMICON WEST 2008 in San Francisco, take this opportunity to visit our new showroom and experience what seperates our capabilities from all others.

If you have any questions at all or need directions please call us at 650-259-5900.

Since its founding in 1951, Kikusui Electronics Corporation has provided a wide variety of Electronic Measuring Instruments, DC and AC Power Supplies, Electronic Loads, and Safety Test Equipment.

The company has a customer-focused reputation making it a trusted source for engineers involved in R&D, quality assurance, incoming inspection and production test around the world.

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Other Product Announcements from Kikusui America, Inc.
EMC Transient Immunity Tester For the Auto Market, High Quality Tester for your production needs, Hipot and Insulation Resistance Tester, 6kW Regenerative DC Electronic Load, Variable-switching Multi Range DC Power Supply , PFX2000 System Battery Test System: 6 Models, Time Interval DVD/ CD Jitter Meter - KJM6775, FM/AM Stereo Standard Signal Generator , High Voltage Digital Voltmeter (AC/DC 10kV) , FC Impedance Meter - KFM2030, Leakage Current Tester - TOS3200, Harmonic/Flicker Analyzer for IEC61000-3-2/3, Compact AC Power Supply (CV/CF), Arbitrary Waveform Creation Software, PLZ-U Series DC Electronic Load
Other products from Kikusui America, Inc. in EMC Testers
Electrostatic Discharge Simulator -- KES4021, Transient Immunity Tester -- KES7701, Transient Immunity Tester -- KES7702, Voltage Variation Simulator -- KES7400, Voltage Variation Simulator -- KES7401, Voltage Variation Simulator -- KES7402, Voltage Variation Simulator -- KES7403


Supplier:
Kikusui America, Inc.

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