3D Optical Surface Metrology System
Product Announcement from Leica Microsystems, Inc.
The Leica DCM 3D system with dual core technology has been designed for fast, non-invasive assessment of micro and nano structures of technical surfaces, in multiple configurations.
The DCM 3D combines confocal and interferometry technology for high speed and high-resolution measurements down to 0.1nm.
And, the micro display confocal technology, with no moving parts, measures a variety of materials and provides confocal and bright field images simultaneously.