The ultra-thin IPLEX TX II video borescope is available with a 2.2 mm diameter flexible scope or a 1.8 mm rigid scope. Using the flexible scope, you can obtain a wide field of view in spaces where the opening is very small for faster inspections and easier decision making. (read more)

We recently introduced the next generation of Vanta handheld XRF analyzers—the Vanta Max and Vanta Core. Learn the top 5 reasons to choose the Vanta™ Max and Vanta™ Core XRF Analyzers for your work. (read more)

The next-generation Vanta^™ handheld XRF analyzers—Vanta Max and Vanta Core—deliver improved elemental analysis and material identification using smart and cloud-connected technology. (read more)

Supplied with magnetic and suction cup mounting bases, the wire encoder is easy to install on ferromagnetic and nonferromagnetic surfaces. It’s the tool of choice for training and procedure development, and the wire encoder can even be used on site to perform inspections when using other scanners is impractical. (read more)

An easy-to-deploy 2-axis encoding phased array (PA) solution, the semiautomated HydroFORM™ scanner enables fast and reliable wall-thickness mapping and midwall damage detection by acquiring high-resolution data of large surfaces in minimal time. (read more)

Brixton Metals, a Canadian-based exploration company, relies on portable XRF for accurate, rapid drill core analysis. (read more)

If you’ve ever wondered whether there’s a more efficient way to perform weld screening than simply scrolling through B-scans, you’ll want to hear about our solution. With the MXU 5.13 software update, we introduced an innovative B-scan view for the OmniScan™ X3 series that has the potential to revolutionize this time- and attention-consuming technique. (read more)

In this video, learn how augmented reality (AR) stereo microscopes can simplify complex microscope-based manufacturing tasks. Application scientist Megan Farell introduces the SZX-AR1 augmented reality system and explains how it can improve assembly, training, and other tasks at the microscope. (read more)

Simplify complex microscope-based manufacturing with the SZX-AR1 Augmented Reality Microscope System. (read more)

Simple-to-use PRECiV™ software puts you in control of your microscope so that you can perform repetitive, 2D measurements during production, quality control, and inspection operations. (read more)

The LC35 microscope camera makes capturing quality brightfield images affordable. With a 3.5-megapixel CMOS sensor and versatile exposure times and resolution modes, the camera’s provides quality brightfield images in a cost-effective package. (read more)

The new OmniScan™ X3 64 flaw detector delivers improved power and performance to Evident Scientific/Olympus’ field-proven phased array ultrasonic testing (PAUT) product line. This 64-channel instrument has the pulser capacity to drive phased array (PA) probes with a larger number of elements, increasing the data acquisition speed for total focusing method (TFM) imaging. (read more)

The new 72DL PLUS™ ultrasonic thickness gauge delivers precision thickness measurements at high speed in a portable, easy-to-use device. With fast scanning, advanced algorithms and Olympus’ lowest-ever minimum thickness capability, the gauge can measure the thickness of very thin layers for challenging applications across industries. (read more)

Olympus Corporation (“Olympus”) announced the completion of the separation of its Scientific Solutions business to a wholly-owned subsidiary, Evident Corporation (“Evident”). Following the divestiture of its Imaging business, this move further signifies the company’s long-term strategy to cement its position as a major player in the medtech industry. (read more)

Built for failure analysis and material engineering research, Olympus' OLS5100 3D laser scanning microscope combines exceptional measurement accuracy and optical performance with smart tools that make the microscope easy to use, allowing for smart work flow and faster experiments. (read more)

Optimized for long seam weld inspection, such as in electric resistance welded (ERW) pipes, the AxSEAM™ scanner’s simple design minimizes the number of adjustments required when changing pipe diameters, probe separation, or scan orientation. (read more)

The Vanta Element XRF analyzer series provides elemental analysis for fast alloy grade identification and sorting at an affordable price. The series is available in two cost-effective models. (read more)

The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. (read more)

The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufacturers who maintain the high quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. (read more)

OmniScan flaw detectors have long been recognized as the workhorse of phased array weld inspection. The X3 flaw detector is even better with setup, imaging, and analysis tools that make weld inspection easier. (read more)

Phased array for corrosion inspection offers many benefits, including excellent coverage and resolution. But becoming proficient in phased array techniques can be challenging. The X3 flaw detector combines advanced functionality with thoughtfully designed software and simplified menus so that you can get accurate data with fewer complications. (read more)

Introducing the latest member of the OmniScan™ family - the new OmniScan X3 flaw detector. On top of its high-quality, highly detailed imaging, the OmniScan X3 flaw detector is packed full of innovative simulation and visualization tools that enable you to verify and validate your inspection on the spot. (read more)

OmniScan^® instruments are recognized globally as the benchmark for portable phased array ultrasonic testing (PAUT) thanks to their power, reliability and ease of use. The new OmniScan X3 flaw detector elevates the standard with innovations that improve the entire inspection workflow. (read more)

With interchangeable insertion tubes and light sources, an 8-inch touch screen, and advanced imaging features, the IPLEX GX/GT videoscope delivers an optimal balance of versatility, imaging capabilities, and ease of use. (read more)

The new DSX1000 digital microscope combines the quality of renowned Olympus optics with the ease of use of digital technologies. Designed to measure and observe a variety of materials, the microscope offers guaranteed high- and low-magnification accuracy and precision* in a single instrument... (read more)

Featuring 4K scanning, an expansion frame, and dedicated objectives, Olympus’ new LEXT® OLS5000 3D laser scanning microscope can acquire surface topography details at the nanometer level with a single click. (read more)

The OLYMPUS CIX100 inspection system is a dedicated, turnkey solution for manufactures who maintain the highest quality standards for the cleanliness of manufactured components. Quickly acquire, process, and document technical cleanliness inspection data to comply with company and international standards. (read more)

Don’t compromise on the inspection capabilities of your flaw detector. The EPOCH^® 6LT portable flaw detector combines the functionality of a powerful ultrasonic flaw detection device with a form factor designed to thrive in rope access and high portability applications. (read more)

Olympus DSX digital microscopes offer easy, single-click 3D image acquisition, guaranteed measurement accuracy, and up to 9,000x magnification, allowing users of all experience levels to obtain fast, accurate inspection results. (read more)

Olympus' Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field. Built to be tough, their rugged and durable design makes them resistant to damage for greater uptime and a lower cost of ownership. (read more)

The Magna-Mike® 8600 is a portable thickness gage that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. (read more)

Olympus MX63 semiconductor industrial inspection microscope systems offer easy, accurate, and comfortable observations of micro-structures on wafers up to 300 mm. The microscopes meet international standards including SEMI S2/S8, CE, and UL. Advanced imaging technology delivers clear micrographs, and an ergonomic design helps minimize user fatigue. (read more)

Olympus converges its latest advancements in high-performance digital circuitry and eddy current flaw detection into one compact and durable portable unit-the new NORTEC® 600. With its crisp and vivid 5.7 inch VGA display and true full-screen mode, the NORTEC 600 is capable of producing highly visible and contrasting eddy current signals in any lighting condition. (read more)

The Fox-IQ provides customized and automated, continuous XRF measurements of Ca to U. It functions in a 24/7 operation for industrial process optimization, increased productivity & improved quality. (read more)

Olympus' entry-level videoscope provides exceptional articulation, durability and great optics to get you the image you need. The instrument is built for use anywhere you need it and packed with features usually reserved for more expensive units. The Series C will save you time and money. (read more)