X-MET5100 combines Oxford Instruments' groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers a five times faster measurement speed, much better detection limits and significant accuracy improvement over conventional systems.
Isn't it time you used X-MET to improve your productivity and screening confidence?
Reliable high speed mapping!
Results obtained in seconds
Portable GPS integration for real-time ore exploration and mine mapping
Measure directly on drill core sample
Certified IP54 NEMA 3 splash and dust proof
Highly accurate multielement ore analysis
User interface in >10 languages
Universal Fundamental
Parameter analysis mode for measurement of ores without known standards
User friendly Empirical Calibration package
Go/No-Go user configurable result format
Rapid data transfer to PC
Rugged and reliable tool for fast, accurate analysis
Withstands all weather conditions and rough treatment
IP54 (NEMA 3) approved. Superior dust and moisture protection
High-strength environmentally sealed housing
Long battery operating time, charge indicator on battery and user interface
High performance
Single-shot analysis of all important elements in ore exploration: Fe, Cu, Cr, Zn, Pb, Mn, Ni, Co, Mo, Ta, W etc.
Rapid analysis with typical easurement times of 10 – 30 seconds (X-MET5000) or 2 – 5 seconds (X-MET5100) depending on the elements of interest and required precision
Low detection limits, X-MET5000 can typically detect 5 – 30 ppm concentration with 120s measuring time.
X-MET5100 detection limits are even lower and ppm level analysis can be done in just 10 – 30 seconds
High speed automatic averaging – calculate averages of 2 – 50 measurements and save both individual results and average results in a log file
Choice of analysis modes
Fundamental Parameter Calculations when standards are not available
Universal calibration to measure over 30 elements between Cl-U
Suitable for wide range of ore types
Empirical Calibration available for optimized accuracy
Create custom calibrations on-site with optional PC software package
Sample measurement is fast and simple
Direct on-site surface measurement for quick pre-screening without sample preparation
Measure from a plastic bag or sample cup in bench-top mode