X-Strata980 XRF for Coating Thickness Analysis

X-Srata980 quickly screen critical assemblies for identification of areas with restricted hazardous elements. It qualitatively analyses a large area in one measurement cycle using the mapping function. Once you have identified problem areas, return to specific spots with pinpoint accuracy and execute quantitative analysis. Mapping of a sample can identify lead containing components or connections within a complex assembly.

The instrument's embedded camera with live video imaging ensures precise sample placement. Generate an image of the entire sample with the concentration or intensity of an element superimposed with a false color map.

Analyzer produces composite maps that display thecombined intensity or concentration of multiple elements.

Trace analysis of hazardous substances

• Solder alloy composition and thickness measurement

• Coating thickness measurement of gold and palladium on electronics

• Coating thickness measurement of metal finish, CVD, PVD

• Precious metal alloy assay and identification