Elemental X-ray Mapping enhanced with Line Scan
Product Announcement from Phenom-World BV
All Phenom-World scanning electron microscopes are intuitive to use, compact, fast to create results and built to high quality standards. The most extended solution in the range is the Phenom proX. The advanced system identifies different elements in a specimen by using the integrated Element Identification software and specially designed EDS detector.
Fully integrated EID software and EDS detector
The EID technique analyzes X-rays generated in the specimen by the bombardment of electrons from an advanced CeB6 electron source. The EID software package is fully integrated, so there is no need to switch between software packages or computers. The software allows users to identify any hidden elements within a sample via the point-and-shoot functionality. Additionally, the software can be expanded with a combined Elemental Mapping and Line Scan option.
Elemental Mapping & Line Scan with many individual choices
Elemental Mapping reveals the distribution of elements within the sample. The selected elements can be mapped at a user-specified pixel resolution and acquisition time. Elements can be added or removed at any time during or after the mapping process. Mapping can be done on the image as a whole, but there is an additional benefit included to save time by adding the Selected Area option. Line Scan allows analysis over a selected line. The key lies in the possibility to select each of the following: number of points, dwell time per point and number of passes. On top of that, the results can be easily exported and reported via an automated template.