Product Announcement from PI (Physik Instrumente) L.P.
Fast Piezo Focusing Stages for High Resolution Microscopes
A new, more affordable series of Fast Piezo Focusing devices is now available from piezo system specialist PI. The new PIFOC® system packages are designed to improve results in fast focusing & lens positioning as well as in deconvolution / 3D imaging, and to reduce costs at the same time.
Features & Advantages
• Complete System with Fast Digital Controller & Software
• Choice of Travel Ranges: 100 µm, 250µm, 400 µm
• Sub-nm Resolution, Ideal for Fast Autofocus Applications
• Choice of Position Feedback Sensors: Piezoresistive (lower cost); Capacitive (higher precision)
• Improved Performance, yet More Affordable
Application Examples: Fast Autofocus Systems, Microscopy, 3D Imaging, Screening, Surface analysis, Wafer inspection
Datasheets & More Information on Piezo Systems for Microscopy at:
Z-Sample Scanners and XYZ Piezo Stages also available