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PI (Physik Instrumente) L.P. - Low Cost Piezo Z- Stage for Microscopy
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Compact Piezo Z-Stages with Aperture for Precision NanoFocussing Applications
- 100 µm Travel Range
- Small Footprint: 60 x 60 mm
- Resolution to 0.2 nm
- For Cost-Sensitive Applications
- Clear Aperture: 20 x 20 mm
- PICMA® High-Performance Piezo Actuators
These elevation stages are cost-effective, compact, piezo-based positioning systems with travel ranges of 100 µm. The space-saving design features a footprint of only 60 x 60 mm. The 20 x 20 mm clear aperture makes them ideally suited for sample positioning in microscopy. Thanks to PICMA® piezo actuator drives and frictionless flexure guidance, they provide response times of a few milliseconds and resolutions in the nanometer range
Other Z-Stages:
- P-541.T0L Low-Profile Piezo-Z Tip/Tilt Stage, open Loop,100µm
- P-541.TCD, Low-Profile Piezo-Z, Tip/Tilt Stage Cap.Sensor,100µm
- P-541.TSL, Low-Profile Piezo-Z Tip/Tilt Stage with SGS,100µm
- P-541.Z0L, Low-Profile Piezo-Z Nanopositioning Stage, 100µm, Open-Loop, Lemo Connector
- P-541.ZCD, Low-Profile Piezo-Z Nanopositioning Stage, 100µm, Cap. Sensors, Sub-D Connector
- P-541.ZCL, Low-Profile Piezo-Z Nanopositioning Stage, 100µm, Cap. Sensors, Lemo Connectors
- P-541.ZSL, Low-Profile Piezo-Z Nanopositioning Stage, 100µm, Strain Gauge Sensors, Lemo Connector
- P-558.TCD, Piezo-Z, Tip/Tilt Nanopositioning Stage, 50µm, 1mrad, Parallel Direct Metrology, for Digital Controller
- P-558.ZCD, Piezo-Z Nanopositioner/Scanning Stage, 50µm, Capacitive Direct Metrology, for Digital Controller
- P-518.TCD, Piezo-Z Tip/Tilt Nanopositioning/Scanning Stage, 100µm, 2mrad, Parallel Direct Metrology, for Digital Controller
- P-518.ZCD, Piezo-Z Nanopositioning/Scanning Stage, 100µm, Capacitive Direct Metrology
- P-528.TCD, Piezo-Z, Tip/Tilt Nanopositioner/Scanning Stage, 200µm, 2mrad, Parallel Direct Metrology, Digital
- P-528.ZCD, Piezo-Z Nanopositioner/Scanning Stage, 200µm, Capacitive Direct Metrology
- P-622.ZCD, PIHera™ Piezo-Z Nanopositioner/Scanning Stage, 250µm, Capacitive Direct Metrology, Sub-D
- P-733.3DD, High-Speed XY, Z-Piezo Nanopositioner/Scanning Stage, 30x30x10µm, Parallel Direct Metrology, 2.2 kHz F-res
- P-563.3CD, PIMars™ XY, Z-Piezo Nanopositioner/Scanning Stage, 300x300x300µm, Parallel Direct Metrology, Sub-D
for more information go to http://www.nanopositioners.com
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