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The A-Zoom2 is a variable power viewing system that represents the next generation of analytical microscopes for use in microelectronics inspection, development, testing, and analysis. Designed for the Probing Market where it is necessary to locate and inspect very fine electronic traces using even finer electronic probes. The microscope used in a probe station or as a stand-alone system, routinely resolves feature geometry in the sub-micron range. The A-Zoom2 does this by combining a zoom system (10X or 40X depending on the model) with a series of long working distance objectives for maximum flexibility. Both eyepieces and video viewing are available. An optional second viewing axis (NAVCAM) may be used for continuous low magnification tracking. Qioptiq's unique laser adapter option offers flexibility for all micro-machining, layer passivation, circuit repairs, test and R & D needs. The A-Zoom2 is available as an OEM Probe Head (with or without an attached focus mechanism), or as a free standing bench model.

Features:

• Unique Single Objective design for high throughput - Eliminates disrupting and time-consuming manipulation of multiple objectives
• Refined Engineering and Ergonomic Design
• Improved Parfocality
• Improved Parcentricity
• Versatile Customization - Can be outfitted to meet a variety of optical requirements