Curved imaging plate crystallography system
Product Announcement from Rigaku Corporation
A compact, fully integrated high-resolution, small molecule crystallography system, the Rigaku R-AXIS RAPID II is the latest member of the RAPID family of large-area curved imaging plate (IP) X-ray diffraction systems. The RAPID II combines every component needed for a high-performance X-ray diffraction system delivering no-compromise performance for applications ranging from applied crystallography to chemical crystallography. The flexible system works with wavelengths from Cr to Ag without compromising data quality. The extremely large aperture means that the full resolution range for any wavelength can be covered very easily. The R-AXIS RAPID is the system of choice for the most demanding applications, including charge-density work, complicated twins and studies on diffuse scattering. Other applications include micro-diffraction, measurement of weakly diffracting disordered materials, wide angle X-ray scattering (WAXS), stress and texture measurements, and general purpose powder diffraction.
Curved detector for maximum reciprocal space coverage
The RAPID II is so versatile that it can replace several instruments without compromising data quality. Its unique, curved large-area detector subtends a 2θ range of 204° at a single detector setting for maximum reciprocal space coverage. The large curved active area is advantageous because a massive solid angle of data is collected in a single exposure. While the wide dynamic range eliminates worrying about detector saturation, the curved-plate geometry of the RAPID II reduces oblique-incidence X-ray absorption effects seen with flat detectors of any kind.
Choice of X-ray sources, including dual wavelength
Inherent to the flexibility of this system is a choice of X-ray sources, ranging from a high-frequency 3 kW sealed tube, to a MicroMax-003 microfocus tube, to a 1.2 kW MicroMax™-007 HF microfocus rotating anode. Available optics range from a traditional graphite monochromator or high-performance SHINE™ optic to a VariMax™ confocal X-ray optic. Dual wavelength is available with the new MicroMax-007 HF DW or FR-E+ DW SuperBright™ optional sources: in this novel approach, two optics are housed in a single assembly, with either optic being selected by a simple rotation. In addition, the patented adjustable divergence feature is maintained for each optic.
- No compromise molecular structure determination
- Multiple and dual wavelengths available
- Cu, Mo, Ag, etc.
- Fast data collection
- High dynamic range and low background noise
- High-resolution charge density measurements
- Measure weakly diffracting disordered materials
- Powder diffraction
- Diffuse scattering