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The new Autograph AG-X Series of testing machines delivers increased precision and productivity with intuitive operation and convenient support functions.

The AG-X Series' portable USB memory and TRAPEZIUM X software make it possible to perform efficient analysis anywhere. The "My Memory – My Tester" feature uses USB memory to hold data and is simply inserted into any AG-X machine. After testing, the USB memory can be used with an office PC to analyze data and create reports. Developed using cutting-edge Microsoft .NET technology, TRAPEZIUM X software allows scientists to combine graphed results from separate tests, create histograms and X-barR charts, and easily access data from any Web-based environment.

This product line uses large-capacity load cells and testing jigs for highly reliable results. It measures loads from 100N to 100kN using a single load cell, eliminating the need for time-consuming jig replacements. Scientists can capture all necessary data in a single test while achieving precision within ±0.5 percent with a 1/1000 load cell.

Other standard features include 32-bit, 144-mHz MPU, FPGA-controlled synchronized sampling and motor control, 5 kHz sample, 1M pulse per second resolution, seven analog input channels, three digital input channels, and precision positioning for all speeds. These features result in reliable data, accurate control, and quality resolution produced at high speed.

The AG-X testing machine is equipped standard with an additional 200 customer-requested features, including multiple channel data acquisition, nine language interfaces, resistance values acquisition, and scheduling functions. Additionally, this "smart" instrument performs quick, automatic self-diagnostics to ensure proper functionality.