Product Announcement from Shimadzu Scientific Instruments, Inc.


IRAffinity-1 FTIR Spectrophotometer-Image

Shimadzus designed the IRAffinity-1 Fourier Transform Infrared (FTIR) spectrophotometer with high-throughput optics and a dynamic alignment mechanism to increase sensitivity, stability and usability. The IRAffinity-1 is ideal for high-precision infrared analysis to confirm, identify and detect foreign matter in raw materials, medical products, packages and coatings.

The IRAffinity-1 offers the highest signal-to-noise ratio (sensitivity) in its class at 30,000:1, with a maximum resolution of 0.5 cm-1 (according to Shimadzu's investigation in January 2008). The unit achieves this level of sensitivity by using a high-energy ceramic light source; temperature-controlled, high-sensitivity DLATGS detector; and high-throughput optical elements. Also, the IRAffinity-1 includes optimized electrical and optical systems to minimize noise levels.

The IRAffinity-1 includes patented technology to increase stability and precision. Its moving mirror is run smoothly and precisely by a flexible joint system patented by Shimadzu. The interferometer is optimized and stabilized by a dynamic alignment mechanism on which Shimadzu has a patent pending. The interferometer's optical elements are protected from humidity and stabilized by a sealed interferometer, continuously removing moisture by a reactive polymeric desiccator, and coating the beam splitter with moisture-resistant protective film.

To increase reliability, the IRAffinity-1 executes self-diagnosis at initialization and monitors the state of the instrument during operation. Users can check basic performance using a standard-feature validation program.

IRsolution software, standard in the IRAffinity-1, emphasizes operability and analysis support programs to perform data processing and analysis. With IRsolution specialized windows, users can easily perform standard operations, such as measurement, display, data processing, quantitative analysis, search and printing. A variety of optional programs and accessories, such as those facilitating PLS and multilinear regression, deconvolution, and mapping measurement, are also available.

 
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