StellarNet, Inc. announces a new line of Thin Film measurement systems starting as low as $10k. The systems come complete with the necessary hardware and software and include a large library of materials data to support multilayer, freestanding, rough, and both thick & thin layer structures. Thickness and optical constants (n, k) can be measured quickly and easily using reflectance and/or transmittance spectroscopy while measurement and data analysis is provided in seconds. With USB connectivity and powerful, user-friendly TFCompanion software, daily complex measurements are made quick and simple. Supported parameterized materials include Cauchy, Sellmeir, EMA (effective-medium approximation), Harmonic oscillator, Tauc-Lorentz oscillator, Drude-Lorentz, and many more.
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