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Varian, Inc. - The Fastest Dual Wavelength Diffraction System

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The SuperNova is the first dual wavelength diffraction system to use entirely high intensity micro-source X-ray technology.

Innovations in both X-ray technology and data analysis, enable faster results even for the most challenging crystals. The SuperNova's X-ray sources provide up to 4x the intensity of traditional sealed tube systems and up to 3x the intensity of a 5kW rotating anode.

The significant improvement in the intensity of X-ray radiation placed on the sample from the dual Nova™ and Mova™ X-ray micro-sources makes both higher resolution and higher throughput possible for a wide range of applications in small molecule and protein crystallography.

Some of the SuperNova features:

  • Easy sample mounting and manipulation.
  • Ultra compact design at 0.5 m2.
  • Radiation safe.
  • AutoChem Software provides full automation from data collection through structure solution and refinement.
  • Virtually instantaneous switching between Mo and Cu wavelengths automatically programmed or manually controlled.
  • CCD detectors deliver the fastest speed, highest sensitivity, highest gain, highest precision, highest dynamic range, and the lowest noise.

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