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The Dimension® Icon™ - AFM Performance and Productivity Redefined
Incorporating the latest evolution of Veeco's industry-leading tip-scanning AFM technology, the Icon™'s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y. This is extraordinary performance in a large-sample, 90-micron scan range system, surpassing the noise performance of most open-loop, high-resolution AFMs.
In addition to superior resolution, many of the Icon™'s new features are designed specifically to increase usability and productivity for both new and expert AFM researchers:
The Dimension® Icon™'s uncommon ease of use, ultimate performance, exceptional productivity, and superior versatility make it the obvious choice for practically every AFM application. It has never been so easy to get so much high-quality data so quickly.
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About Veeco Instruments:
Veeco provides the tools to make, measure and visualize today's world-changing technologies. From data storage, semiconductor, LED, solar and wireless to the frontiers of life science, materials science and nanotechnology, Veeco drives the tiny changes that change everything. Click Here for more company information.
Please contact Veeco Instruments, Inc. for more information regarding Dimension® Icon™ or request a quote today!