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The di MultiMode V represents the next generation of the world's best-selling, most field-proven SPM. It performs the full range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields. A short mechanical path length between probe tip and sample provides very fast scan rates with the utmost precision.

The system's new NanoScope V controller delivers reliable, high-speed data capture of high-pixel-density images (5120 x 5120) union allowing researchers to record and analyze tip-sample interactions that probe nanoscale events at timescales previously inaccessible to SPM. This state-of-the-art controller enables up to eight images to be simultaneously displayed/captured, offers outstanding software functionality and compatibility, and features Easy-AFM an intuitive, easy-to-follow graphic user interface for new or infrequent SPM users that streamlines every step of instrument operation.

Now available with a closed-loop scanner option, see under Accessories and Options for details.