The Wyko NT9800 Optical Profiler employs coherence scanning interferometry, also known as white-light interferometry, white-light confocal, or vertical scanning interferometry to produce high quality three-dimensional surface maps of the object under test. It delivers rapid, non-contact measurements from 0.1 nanometer up to 10 millimeters, with sub-nanometer resolution. A proprietary internal laser reference provides continuous self-calibration to minimize dependence on step standards, and to compensate for system drift due to environmental conditions. This ninth generation of the industry-leading NT Series product line also features a comprehensive suite of automation tools, an easy-to-use interface, and industry-best Wyko Vision analysis software. With its combination of advanced features, proven metrology core, and available application-specific software routines, the NT9800 system is the most advanced optical interferometric instrument available for production and research in MEMS, metals, materials, semiconductors, medical devices, and more.
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