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When ultimate level of analytical performance is needed, Xenemetrix (formerly JV) EX-6600 energy dispersive x-ray fluorescence (EDXRF) spectrometer is unequaled. High levels of sensitivity and selectivity are achieved through the use of a secondary target excitation mode, which delivers rapid determinations for trace and minor constituents in difficult samples, with typical MDL's of 1 ppm or less. Analyze fluorine (F) through uranium (U) with or without standards from part-per-billion to high weight percents. Our patented Wide Angle Geometry (WAG™) optical system and our easy to use WindowsNT® based operating software make the EX-6600 first EDXRF system to offer no compromises: sensitivity and speed of a WDXRF analyzer at a fraction of price.

Applications

• Coatings & Thin Films
• Environmental
• Food & Drug
• Forensics
• Metallurgical Mining & Minerals
• Petroleum & Petrochemicals