Nikon Metrology is pleased to announce the release of SMZ1270, a stereo microscope with the largest zoom ratio in its class, SMZ1270i, a version of SMZ1270 with intelligent features, and SMZ800N with enhanced optics and operability. Read more...More Product Announcements from Nikon Metrology
The Leica Z16 APO is a fully apochromatic zoom system for high contrast, high-resolution, detailed analysis. The single beam path provides 2D images and ensures parallax-free imaging Read more...More Product Announcements from Leica Microsystems, Inc.
One of the main features of a digital microscope is the speed & ease with which it can enable creation of surface models of macro & microscopic structures. In a qualitative evaluation, these provide a better understanding & a more detailed documentation of the specimen. In addition quantification of the surface provides information about the composition of the surface Read more...More Product Announcements from Leica Microsystems, Inc.
The new A-Zoomµ Micro Probing Microscope offers an economical solution for wafer probing without sacrificing feature, function or performance. Unique single-objective design with manual 7:1 zoom provides excellent viewing flexibility and ample space for multiple probe tips. Also eliminates cumbersome nose turret manipulation, making it ideal for vacuum chamber applications. Visit ww... Read more...More Product Announcements from Qioptiq
Titan Tool Supply, Inc. Optical Drill Geometry Analyzer Model OTWD-1 for drill sizes 1/16" to 7/16" & OTWD-2 for drill sizes 7/16" to 1-1/4" are inexpensive optical instruments available for checking of proper twist drill re-sharpening. Whether this is done free hand on a fixture or on a more expensive drill sharpening machine, industry lacks a quick and easy way of checking the resu... Read more...More Product Announcements from Titan Tool Supply, Inc.
The BZ-9000 (BIOREVO) represents a revolutionary approach to conventional fluorescence microscopy. This fully-integrated system is capable of performing fluorescence, bright field and phase-contrast imaging on a variety of specimen holders (slides, dishes, well-plates, etc.) - without the need for a darkroom. Read more...More Product Announcements from KEYENCE
Perform profile and roughness measurements on nearly any material. The KEYENCE VK-X Series 3D Laser Scanning Microscopes combine the capabilities of SEMs and non-contact roughness gauges with the simplicity of an optical microscope. Read more...More Product Announcements from KEYENCE
The Olympus AL120™ wafer handling system is the newest generation of the company's AL wafer handling systems, delivering the renowned performance and reliability for which Olympus microelectronics products are known. Read more...More Product Announcements from Olympus Scientific Solutions America