Olympus is pleased to announce the release of the Window Guard system, designed to save customers thousands of dollars in costly repair bills and down time, for its DELTA Handheld XRF Alloy Analyzers. The Window Guard system is ideal when conditions get really tough and especially for testing metal turnings, shavings and protruding components. Read more...More Product Announcements from Olympus Corporation of the Americas - Scientific Solutions Group
The X-ray source and detector are the heart of an X-ray fluorescence instrument. The FISCHERSCOPE XDV-SDD (silicon drift detector) is excellent for measuring very thin layers, trace elements, very small concentrations, elements with low atomic numbers (Na, Mg and Al) using high counting rates for fast measurement and high repeatability. Read more...More Product Announcements from Fischer Technology, Inc.
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Oxford Instruments provides solutions for almost any coating thickness testing requirement and budget.
• Oxford Instruments benchtop analyzers
• Oxford Instruments handheld analyzers
Minimize production costs for plating and maximize efficiencies. Read more...More Product Announcements from Oxford Instruments
Visit Fischer at PCB West and learn about how to deal with extremely diverse and often very challenging measuring applications in the electronics industry. FISCHER offers a broad range of X-ray fluorescence measurement systems to ensure the ideal instrument is available to suit the particular needs of the customer. Read more...More Product Announcements from Fischer Technology, Inc.
FISCHERSCOPE® XDAL® 237 is especially well suited for measuring and analyzing very thin coatings, even with very complex compositions or small concentrations. With its fast, programmable X/Y-stage, it is the perfect instrument for automated measurements in quality assurance and production monitoring. Read more...More Product Announcements from Fischer Technology, Inc.
Oxford Instruments Lab-X3500 increases productivity with field proven X-Ray Fluorescence (XRF) analysis saving you both time and money. Lab-X is designed to perform in a laboratory or on-site and its rugged design makes it highly reliable and an extremely affordable solution to meet your quality control needs.
The well-established X-ray fluorescence method (XRF) provides an excellent alternative for analyzing the content of precious metals – without damaging the object. Read more...More Product Announcements from Fischer Technology, Inc.
Specialized for the cost-effective analysis of gold alloys, FISCHERSCOPE® X-RAY XAN® family of instruments are available with different detectors, making them optimally suited for customer requirements, from a few elements to more complex analysis with many elements. Read more...More Product Announcements from Fischer Technology, Inc.
FISCHER’s high-precision, fast and user-friendly XRF measurement systems are perfect for analyzing the metallic content of plating solutions. Read more...More Product Announcements from Fischer Technology, Inc.
Fischer Technology is pleased to announce the capability of non-destructively measuring simultaneously the phosphorous content and thickness in electroless nickel (NiP) coatings using X-ray Fluorescence Instrumentation (XRF). Read more...More Product Announcements from Fischer Technology, Inc.