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Products, equipment and solutions used in laboratories for the preparation, separation and analysis of samples.
Shimadzu Scientific Instruments, Inc.

The new EDX-LE from Shimadzu is an energy dispersive X-ray (EDX) fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. Its automated analysis functions improve operability without sacrificing a high level of inspection reliability. Read more...

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Oxford Instruments

Oxford Instruments, a leader in coating thickness analysis, has newly added the COMPACT Eco and MAXXI Eco to its product line for coating thickness. These instruments are affordable and have several flexible options available. The COMPACT Eco and MAXXI Eco have a large chamber with optional XYZ table and are ideal for general metal finishing, electronics and jewelry. Read more...

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Shimadzu Scientific Instruments, Inc.

Incorporating a new high-performance semiconductor detector, the EDX-7000/8000 spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research. Read more...

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Oxford Instruments

The innovative, high performance X-Supreme8000, is a compact, energy-dispersive X-ray fluorescence (EDXRF) spectrometer used for quality assurance, inspection, and process control across a diverse range of industries.

Email Oxford Instruments: industrial@oxinst.com or call 978-369-9933 Read more...

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Oxford Instruments

The innovative, high performance X-Supreme8000, is a compact, energy-dispersive X-ray fluorescence (EDXRF) spectrometer used for quality assurance, inspection, and process control across a diverse range of industries.

Email Oxford Instruments: industrial@oxinst.com or call 978-369-9933 Read more...

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Oxford Instruments

MAXXI 6 for precision coating thickness testing of large parts at incoming inspection, on the line, and at final quality check. Superior resolution and high efficiency SDD, makes MAXXI 6 the ideal instrument for measuring the thinnest coatings down to nanometer scale and trace level element composition. Email: industrial@oxinst.com Read more...

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Fischer Technology, Inc.

The well-established X-ray fluorescence method (XRF) provides an excellent alternative for analyzing the content of precious metals – without damaging the object. Read more...

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Fischer Technology, Inc.

FISCHERSCOPE® XDAL® is especially well suited for measuring and analyzing very thin coatings, even with very complex compositions or small concentrations. With its fast, programmable X/Y-stage, it is the fitting measuring instrument for automated measurements in quality assurance and production monitoring. Read more...

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Fischer Technology, Inc.

Specialized for the cost-effective analysis of gold alloys, FISCHERSCOPE® X-RAY XAN® family of instruments are available with different detectors, making them optimally suited for customer requirements, from a few elements to more complex analysis with many elements. Read more...

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Fischer Technology, Inc.

FISCHER’s high-precision, fast and user-friendly XRF measurement systems are perfect for analyzing the metallic content of plating solutions. Read more...

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