The new EDX-LE from Shimadzu is an energy dispersive X-ray (EDX) fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. Its automated analysis functions improve operability without sacrificing a high level of inspection reliability. Read more...More Product Announcements from Shimadzu Scientific Instruments, Inc.
Incorporating a new high-performance semiconductor detector, the EDX-7000/8000 spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research. Read more...More Product Announcements from Shimadzu Scientific Instruments, Inc.
New to the Oxford Instruments coating thickness product line is the MAXXI 5, ideal for users who demand the highest measuring precision and versatility from X-Ray Fluorescence (XRF) technology especially when non-destructive testing of solids and liquids is required. MAXXI 5 was developed with the metal finisher in mind.
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Measuring applications in the electronics industry are extremely diverse and often very challenging. To ensure the ideal instrument is available to suit the particular needs of the customer, FISCHER offers a broad range of X-ray fluorescence measurement systems. Read more...More Product Announcements from Fischer Technology, Inc.
The NANO-MASTER is an innovative µ-XRF benchtop analyser for the measurement of the latest generation of very small electronic components and thin coatings using standardless analysis down to the nanometre scale.
The NANO-MASTER has the lowest limits of detection and allows component compliance testing to RoHS, WEEE, ELV specifications.
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Oxford Instruments, a leader in coating thickness analysis, has newly added the COMPACT Eco and MAXXI Eco to its product line for coating thickness. These instruments are affordable and have several flexible options available. The COMPACT Eco and MAXXI Eco have a large chamber with optional XYZ table and are ideal for general metal finishing, electronics and jewelry. Read more...More Product Announcements from Oxford Instruments
As with all types of coatings, the PVD process must also be closely monitored and the thickness of the PVD-deposited layer measured. Alongside standard destructive testing methods, the non-destructive X-ray fluorescence method (XRF) is preferable for this purpose. Read more...More Product Announcements from Fischer Technology, Inc.
Measure and analyze very thin coatings, even with complex compositions with the FISCHERSCOPE® XDAL® Read more...More Product Announcements from Fischer Technology, Inc.
The well-established X-ray fluorescence method (XRF) provides an excellent alternative for analyzing the content of precious metals – without damaging the object. Read more...More Product Announcements from Fischer Technology, Inc.
The FISCHERSCOPE® X-RAY XAN® 315 is the cost-effective entry-level X-ray fluorescence measuring instrument for non-destructive analysis of jewelry, coins and precious metals. Read more...More Product Announcements from Fischer Technology, Inc.