Fischer Technology, Inc.

As with all types of coatings, the PVD process must also be closely monitored and the thickness of the PVD-deposited layer measured. Alongside standard destructive testing methods, the non-destructive X-ray fluorescence method (XRF) is preferable for this purpose. Read more...

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Oxford Instruments Industrial Analysis

Oxford Instruments, a leader in coating thickness analysis, has newly added the COMPACT Eco and MAXXI Eco to its product line for coating thickness. These instruments are affordable and have several flexible options available. The COMPACT Eco and MAXXI Eco have a large chamber with optional XYZ table and are ideal for general metal finishing, electronics and jewelry. Read more...

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Oxford Instruments Industrial Analysis

The X-MET7000 series handheld X-Ray Fluorescence (XRF) analyzer is an affordable inspection tool for your quality department, which can help to improve efficiencies, save money and minimize global supply chain risks in the lab or out in the field.

Get a QUOTE today! Email: industrial@oxinst.com or phone: 800-447-4717 or 978-369-9933 Read more...

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Shimadzu Scientific Instruments, Inc.

Incorporating a new high-performance semiconductor detector, the EDX-7000/8000 spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research. Read more...

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Fischer Technology, Inc.

Measure and analyze very thin coatings, even with complex compositions with the FISCHERSCOPE® XDAL® Read more...

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Fischer Technology, Inc.

The well-established X-ray fluorescence method (XRF) provides an excellent alternative for analyzing the content of precious metals – without damaging the object. Read more...

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Fischer Technology, Inc.

The FISCHERSCOPE® X-RAY XAN® 315 is the cost-effective entry-level X-ray fluorescence measuring instrument for non-destructive analysis of jewelry, coins and precious metals. Read more...

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Fischer Technology, Inc.

Fischer Technology is pleased to announce the capability of non-destructively measuring simultaneously the phosphorous content and thickness in electroless nickel (NiP) coatings using X-ray Fluorescence Instrumentation (XRF). Read more...

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Oxford Instruments Industrial Analysis

In the mine you need analysis that you can count on and an instrument that is durable and easy to use. Oxford Instruments has been making portable X-Ray Fluorescence (XRF) analyzers for 35+ years and now we have developed an analyzer specifically to meet all your needs mining needs. Get laboratory results in the field. Email industrial@oxinst.com or call +1 800 447 4717/+1 978 369 9933 Read more...

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Oxford Instruments Industrial Analysis

Oxford Instruments Lab-X3500 increases productivity with field proven X-Ray Fluorescence (XRF) analysis saving you both time and money. Lab-X is designed to perform in a laboratory or on-site and its rugged design makes it highly reliable and an extremely affordable solution to meet your quality control needs.

Email industrial@oxinst.com or call +1 800 447 4717/+1 978 369 9933 Read more...

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