The NEW X-MET8000 handheld X-Ray Fluorescence (XRF) analyzer is the flexible & easy-to-use tool of choice for rapid, on-site sorting of scrap metals. It provides the precision of lab-quality analysis in the scrapyard. It's rugged design makes it water and dust resistant for use in even the harshest environments and its screen has superior visibility even in direct sunlight. IS... Read more...More Product Announcements from Oxford Instruments
FISCHER’s high-precision, fast and user-friendly XRF measurement systems are perfect for analyzing the metallic content of plating solutions. Read more...More Product Announcements from Fischer Technology, Inc.
Fischer Technology is pleased to announce the capability of non-destructively measuring simultaneously the phosphorous content and thickness in electroless nickel (NiP) coatings using X-ray Fluorescence Instrumentation (XRF). Read more...More Product Announcements from Fischer Technology, Inc.
The new EDX-LE from Shimadzu is an energy dispersive X-ray (EDX) fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. Its automated analysis functions improve operability without sacrificing a high level of inspection reliability. Read more...More Product Announcements from Shimadzu Scientific Instruments, Inc.
Incorporating a new high-performance semiconductor detector, the EDX-7000/8000 spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research. Read more...More Product Announcements from Shimadzu Scientific Instruments, Inc.
New to the Oxford Instruments coating thickness product line is the MAXXI 5, ideal for users who demand the highest measuring precision and versatility from X-Ray Fluorescence (XRF) technology especially when non-destructive testing of solids and liquids is required. MAXXI 5 was developed with the metal finisher in mind.
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Measuring applications in the electronics industry are extremely diverse and often very challenging. To ensure the ideal instrument is available to suit the particular needs of the customer, FISCHER offers a broad range of X-ray fluorescence measurement systems. Read more...More Product Announcements from Fischer Technology, Inc.
The NANO-MASTER is an innovative µ-XRF benchtop analyser for the measurement of the latest generation of very small electronic components and thin coatings using standardless analysis down to the nanometre scale.
The NANO-MASTER has the lowest limits of detection and allows component compliance testing to RoHS, WEEE, ELV specifications.
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Oxford Instruments, a leader in coating thickness analysis, has newly added the COMPACT Eco and MAXXI Eco to its product line for coating thickness. These instruments are affordable and have several flexible options available. The COMPACT Eco and MAXXI Eco have a large chamber with optional XYZ table and are ideal for general metal finishing, electronics and jewelry. Read more...More Product Announcements from Oxford Instruments
As with all types of coatings, the PVD process must also be closely monitored and the thickness of the PVD-deposited layer measured. Alongside standard destructive testing methods, the non-destructive X-ray fluorescence method (XRF) is preferable for this purpose. Read more...More Product Announcements from Fischer Technology, Inc.