Oxford Instruments

Introducing Oxford Instruments' X-MET8000 Expert Geo handheld XRF (X-ray fluorescence) analyse for geochemistry applications including fast on-site environmental screening, mining exploration, planning and grade control. Read more...

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Fischer Technology, Inc.

FISCHERSCOPE® XDAL® 237 is especially well suited for measuring and analyzing very thin coatings, even with very complex compositions or small concentrations. With its fast, programmable X/Y-stage, it is the perfect instrument for automated measurements in quality assurance and production monitoring. Read more...

More Product Announcements from Fischer Technology, Inc.
Fischer Technology, Inc.

Visit Fischer at IPC Apex 2018 and learn about how to deal with extremely diverse and often very challenging measuring applications in the electronics industry. FISCHER offers a broad range of X-ray fluorescence measurement systems to ensure the ideal instrument is available to suit the particular needs of the customer. Read more...

More Product Announcements from Fischer Technology, Inc.
Fischer Technology, Inc.

FISCHER’s high-precision, fast and user-friendly XRF measurement systems are perfect for analyzing the metallic content of plating solutions. Read more...

More Product Announcements from Fischer Technology, Inc.
Fischer Technology, Inc.

FISCHER’s high-precision, fast and user-friendly XRF measurement systems are perfect for analyzing the metallic content of plating solutions. Read more...

More Product Announcements from Fischer Technology, Inc.
Fischer Technology, Inc.

The X-ray source and detector are the heart of an X-ray fluorescence instrument. The FISCHERSCOPE XDV-SDD (silicon drift detector) is excellent for measuring very thin layers, trace elements, very small concentrations, elements with low atomic numbers (Na, Mg and Al) using high counting rates for fast measurement and high repeatability. Read more...

More Product Announcements from Fischer Technology, Inc.
Fischer Technology, Inc.

FISCHERSCOPE® XDAL® 237 is especially well suited for measuring and analyzing very thin coatings, even with very complex compositions or small concentrations. With its fast, programmable X/Y-stage, it is the perfect instrument for automated measurements in quality assurance and production monitoring. Read more...

More Product Announcements from Fischer Technology, Inc.
Oxford Instruments

Oxford Instruments Lab-X3500 increases productivity with field proven X-Ray Fluorescence (XRF) analysis saving you both time and money. Lab-X is designed to perform in a laboratory or on-site and its rugged design makes it highly reliable and an extremely affordable solution to meet your quality control needs.

Email industrial@oxinst.com or call +1 800 447 4717/+1 978 369 9933 Read more...

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Fischer Technology, Inc.

The well-established X-ray fluorescence method (XRF) provides an excellent alternative for analyzing the content of precious metals – without damaging the object. Read more...

More Product Announcements from Fischer Technology, Inc.
Fischer Technology, Inc.

Specialized for the cost-effective analysis of gold alloys, FISCHERSCOPE® X-RAY XAN® family of instruments are available with different detectors, making them optimally suited for customer requirements, from a few elements to more complex analysis with many elements. Read more...

More Product Announcements from Fischer Technology, Inc.