Fischer Technology is pleased to announce the capability of non-destructively measuring simultaneously the phosphorous content and thickness in electroless nickel (NiP) coatings using X-ray Fluorescence Instrumentation (XRF). Read more...More Product Announcements from Fischer Technology, Inc.
Oxford Instruments Lab-X3500 increases productivity with field proven X-Ray Fluorescence (XRF) analysis saving you both time and money. Lab-X is designed to perform in a laboratory or on-site and its rugged design makes it highly reliable and an extremely affordable solution to meet your quality control needs.
Email firstname.lastname@example.org or call +1 800 447 4717/+1 978 369 9933 Read more...More Product Announcements from Oxford Instruments
Incorporating a new high-performance semiconductor detector, the EDX-7000/8000 spectrometers offer excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research. Read more...More Product Announcements from Shimadzu Scientific Instruments, Inc.
New to the Oxford Instruments coating thickness product line is the MAXXI 5, ideal for users who demand the highest measuring precision and versatility from X-Ray Fluorescence (XRF) technology especially when non-destructive testing of solids and liquids is required. MAXXI 5 was developed with the metal finisher in mind.
Email email@example.com or call +1 978 369 9933 Read more...More Product Announcements from Oxford Instruments
Oxford Instruments, a leader in coating thickness analysis, has newly added the COMPACT Eco and MAXXI Eco to its product line for coating thickness. These instruments are affordable and have several flexible options available. The COMPACT Eco and MAXXI Eco have a large chamber with optional XYZ table and are ideal for general metal finishing, electronics and jewelry. Read more...More Product Announcements from Oxford Instruments
As with all types of coatings, the PVD process must also be closely monitored and the thickness of the PVD-deposited layer measured. Alongside standard destructive testing methods, the non-destructive X-ray fluorescence method (XRF) is preferable for this purpose. Read more...More Product Announcements from Fischer Technology, Inc.
Olympus NDT is pleased to announce the release of new, advanced software for DELTA handheld X-ray fluorescence (XRF) analyzers which provides three new analysis modes - GeoChem, Precious Metals and RoHS Plus Read more...More Product Announcements from Olympus Scientific Solutions America
Olympus NDT is pleased to announce that the 50kV powered DELTA DP-4050 Handheld X-ray Fluorescence (XRF) Analyzer for Environmental, Geochemical, Mining, and Exploration applications is now available for use in Canada. Read more...More Product Announcements from Olympus Scientific Solutions America
Olympus NDT is pleased to announce the release of a new handheld X-ray fluorescence analyzer, the DELTA Professional with X-act Count technology. Coupled with a 40kV tube and Silicon Drift Detector (SDD), the DELTA Professional is the best value solution from Olympus for handheld XRF analyzers. Read more...More Product Announcements from Olympus Scientific Solutions America