FISCHERSCOPE® XDAL® 237 is especially well suited for measuring and analyzing very thin coatings, even with very complex compositions or small concentrations. With its fast, programmable X/Y-stage, it is the perfect instrument for automated measurements in quality assurance and production monitoring. Read more...More Product Announcements from Fischer Technology, Inc.
Specialized for the cost-effective analysis of gold alloys, FISCHERSCOPE® X-RAY XAN® family of instruments are available with different detectors, making them optimally suited for customer requirements, from a few elements to more complex analysis with many elements. Read more...More Product Announcements from Fischer Technology, Inc.
Fischer Technology is pleased to announce the capability of non-destructively measuring simultaneously the phosphorous content and thickness in electroless nickel (NiP) coatings using X-ray Fluorescence Instrumentation (XRF). Read more...More Product Announcements from Fischer Technology, Inc.
Oxford Instruments Lab-X3500 increases productivity with field proven X-Ray Fluorescence (XRF) analysis saving you both time and money. Lab-X is designed to perform in a laboratory or on-site and its rugged design makes it highly reliable and an extremely affordable solution to meet your quality control needs.
Email firstname.lastname@example.org or call +1 800 447 4717/+1 978 369 9933 Read more...More Product Announcements from Hitachi High-Tech Analytical Science