Zygo Corporation

The APM650™ packaging metrology system is a new inspection tool for automated measurement of panel-based PCBs and other advanced packaging applications. It provides 2D & 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral precision. Read more...

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VISIONx Inc.

The VisionGauge® Digital Optical Comparator’s CAD Auto Pass/Fail™ tool computes and displays in real time, a part’s deviation from nominal for automatic Pass/Fail results. Read more...

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Mahr Inc.

Features longest drive, fastest positioning and measuring speed in industry

Innovative biomimetic probe arm design with magnetic mounting, automatic probe recognition Read more...

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Mahr Inc.

The XR 1 combines the portable drive units of the MarSurf M-Series units with the PC‑based evaluation software of larger MarSurf XR-Series systems

Utilizing wireless Bluetooth technology, the XR 1 offers an affordable entry into higher-end surface metrology systems Read more...

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Mahr Inc.

Features high measuring speed, horizontal travel up to 260 mm, vertical resolution to 0.8 nm

Designed for checking topography during multi-step grinding/polishing operations

Backed by Mahr worldwide network for service and application support Read more...

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Lapmaster-Wolters International

For over fifty years, Lapmaster has been a leader in the manufacturing of industrial lapping machines and consumables. Lapmaster International now offers a complete turnkey solution for Metallographic Sample Preparation. Combining our comprehensive line of Sample Preparation Equipment and Quality Processing Consumables Read more...

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Lapmaster-Wolters International

The Lapmaster/LAMTech TOPOS and SPI series of Interferometers feature Grazing Incidence flatness inspection and measurement capability for ground, lapped & polished surfaces. Use of this system eliminates the need to generate a polished surface, strictly for optical flatness measurement. Ground surfaces, matte surfaces and polsihed surfaces can all be measured with one unit! Read more...

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