The CHRocodile IT line of sensors from Precitec Optronik offers a highly accurate thickness measurement for infrared transparent materials. They are capable of non-contact scanning with a small spot size for use on all portions of the device. Read more...More Product Announcements from Precitec, Inc.
MAZeT offers customer-specific solutions for communication interfaces of the automation engineering industries. Read more...More Product Announcements from MAZeT GmbH
Proforma 300/G - Manual, non-contact measurement system for wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures most wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape. Read more...More Product Announcements from MTI Instruments Inc.
Solar Wafer Thickness Tool from MTI. The PV-1000 is a High speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials. Read more...More Product Announcements from MTI Instruments Inc.