Product Announcements: Semiconductor Metrology Instruments

With the new CHRocodile IT 18 - 3000 the user can measure inline the thickness of the following materials:

• Rough-cut or textured wafers
• Opaque and scattering materials, for example PP- and PET-bottles
• Multilayer systems, for example foils and bonded wafers

Measure elemental contamination at discrete points or with full wafer maps (read more)

The Rigaku MFM65 performs high-precision measurements not possible by optical or ultrasonic techniques. (read more)

Ultra-trace elemental surface contamination metrology by TXRF with VPD capability; up to 300mm wafers (read more)

Proforma 300/G - Manual, non-contact measurement system for wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures most wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape. (read more)

Solar Wafer Thickness Tool from MTI. The PV-1000 is a High speed, multi-channel thickness, TTV and bow measurement module for in-process monitoring of solar/photovoltaic wafers and other materials. (read more)