The MicroSense Polar Kerr System is a full 300 mm wafer, non-contact magnetic metrology tool for perpendicular and in-plane MRAM, providing critical process control information on the multi-layer magnetic stack that is an essential component of MRAM fabrication. This metrology tool offers unsurpassed magnetic field control, and is capable of measuring wafers up to 300 mm. Read more...More Product Announcements from MicroSense, LLC
Cost-effective alternative to fully-automated wafer inspection systems. Read more...More Product Announcements from MTI Instruments Inc.
An alternative to fully automaed metrology tool, the Proforma 300SA is a semi-automated thickness measurement system for both semiconducting and semi-insulating wafer materials. Capable of handling 150mm, 200 mm and 300mm wafers, the 300SA provides highly accurate, repeatable measurements of thickness, TTV, bow, warp, site and global flatness. Read more...More Product Announcements from MTI Instruments Inc.