RAYCON D product inspection system will consistently and precisely detect a multitude of contaminants such as magnetic and non-magnetic metals, glass, ceramics, stones, raw bones, and some types of plastics, even when products are packaged in aluminium or other metallic foils. Read more...More Product Announcements from Sesotec GmbH
AP Windows are ideal for applications that require high transmission of low-energy x-rays in high vacuum with differential pressure and the highest possible vacuum integrity. AP windows are most commonly used in microanalysis applications
Moxtek’s AP windows have established the standard for light element detection x-ray windows. Our AP windows have survived over 10,000 cycl... Read more...More Product Announcements from MOXTEK, Inc.
Measuring applications in the electronics industry are extremely diverse and often very challenging. To ensure the ideal instrument is available to suit the particular needs of the customer, FISCHER offers a broad range of X-ray fluorescence measurement systems. Read more...More Product Announcements from Fischer Technology, Inc.
FISCHER, a manufacturer of nondestructive coating thickness measurement, material testing, and material analysis instrumentation, exhibits at tradeshows around the world. Read more...More Product Announcements from Fischer Technology, Inc.
Precious metals are the basis for jewelry production; however, they are also often used in high-tech industries such as electronics and medicine. Highest purity of the base metals, precise alloying and control of trace and minor elements are the basis of all precious metal products. Read more...More Product Announcements from Fischer Technology, Inc.
As with all types of coatings, the PVD process must also be closely monitored and the thickness of the PVD-deposited layer measured. Alongside standard destructive testing methods, the non-destructive X-ray fluorescence method (XRF) is preferable for this purpose. Read more...More Product Announcements from Fischer Technology, Inc.
MOXTEK's XPIN Detector has a 625µm thick Si-PIN diode, an ultra-low-noise JFET, multilayer collimator, preamplifier, and is internally cooled with a two-stage thermoelectric cooler. Our detectors use DuraBeryllium® windows uniquely coated with DuraCoat®, which is corrosion resistant and ideal for harsh environments. Read more...More Product Announcements from MOXTEK, Inc.
The FISCHERSCOPE® X-ray XDV®-SDD is a high performance X-ray measuring system with a programmable X/Y-stage and Z-axis for automated measurements of very thin coatings and for trace analysis. Read more...More Product Announcements from Fischer Technology, Inc.
X.Tract provides CT-quality inspection results of complex, multi-layer electronics assemblies without slicing them. In a rapid and user friendly process, itenables virtual micro-sections in any direction in the region-of-interest. Read more...More Product Announcements from Nikon Metrology
Inspect-X 4.1, the latest release of the acquisition and analysis software for Nikon Metrology’s range of X-ray and CT systems, provides improved real-time imaging and advanced BGA analysis. The C.Clear real-time image enhancements provide easy-to-interpret images for fast online defect recognition. Read more...More Product Announcements from Nikon Metrology