As with all types of coatings, the PVD process must also be closely monitored and the thickness of the PVD-deposited layer measured. Alongside standard destructive testing methods, the non-destructive X-ray fluorescence method (XRF) is preferable for this purpose. Read more...More Product Announcements from Fischer Technology, Inc.
Measuring applications in the electronics industry are extremely diverse and often very challenging. To ensure the ideal instrument is available to suit the particular needs of the customer, FISCHER offers a broad range of X-ray fluorescence measurement systems. Read more...More Product Announcements from Fischer Technology, Inc.
MOXTEK's XPIN Detector has a 625µm thick Si-PIN diode, an ultra-low-noise JFET, multilayer collimator, preamplifier, and is internally cooled with a two-stage thermoelectric cooler. Our detectors use DuraBeryllium® windows uniquely coated with DuraCoat®, which is corrosion resistant and ideal for harsh environments. Read more...More Product Announcements from MOXTEK, Inc.
The FISCHERSCOPE® X-ray XDV®-SDD is a high performance X-ray measuring system with a programmable X/Y-stage and Z-axis for automated measurements of very thin coatings and for trace analysis. Read more...More Product Announcements from Fischer Technology, Inc.
Precious metals are the basis for jewelry production; however, they are also often used in high-tech industries such as electronics and medicine. Highest purity of the base metals, precise alloying and control of trace and minor elements are the basis of all precious metal products. Read more...More Product Announcements from Fischer Technology, Inc.
X.Tract provides CT-quality inspection results of complex, multi-layer electronics assemblies without slicing them. In a rapid and user friendly process, itenables virtual micro-sections in any direction in the region-of-interest. Read more...More Product Announcements from Nikon Metrology
Inspect-X 4.1, the latest release of the acquisition and analysis software for Nikon Metrology’s range of X-ray and CT systems, provides improved real-time imaging and advanced BGA analysis. The C.Clear real-time image enhancements provide easy-to-interpret images for fast online defect recognition. Read more...More Product Announcements from Nikon Metrology
RAYCON product inspection system will consistently and precisely detect a multitude of contaminants such as magnetic and non-magnetic metals, glass, ceramics, stones, raw bones, and some types of plastics, even when products are packaged in aluminium or other metallic foils. Read more...More Product Announcements from Sesotec GmbH
Moxtek components integrate seamlessly for completely custom XRF instrumentation. Our XRF kits include our FTC-200 Controller, MXDPP-50 Controller, X-ray Source, and X-ray Detector. See our complete hardware and software display and learn more at Pittcon booth #1721. Or visit us online at www.moxtek.com Read more...More Product Announcements from MOXTEK, Inc.
In October 2013 we released our new AP5 product. With a new carbon-based support structure, our customers can now enjoy a significantly higher acceptance angle, up to 11% higher solid angle, and up to 20% more transmission for higher overall count rates. AP5 windows can be used in all applications where AP3 windows are used. View our datasheet below for more details. Read more...More Product Announcements from MOXTEK, Inc.