Introducing our new LIV120 laser diode characterization instrument: a CW/QCW tester for measuring LIV curves and spectra of submounted or fully packaged laser diodes, SLEDs and LEDs. This compact unit can be mounted in testing machines or used in a laboratory environment. Full LIV sweeps of up to 4000 currents can be performed. A measurement sweep with 1000 currents takes a... Read more...More Product Announcements from Artifex Engineering
Introducing Artifex Engineering’s extended range of LIV testing equipment. Read more...More Product Announcements from Artifex Engineering
Die zunehmende Nachfrage nach Hochleistungs-Laserdioden mit niedrigen Kosten pro Watt setzt Laserdiodenhersteller unter Druck, ihre Fertigung und den Prüfaufwand zu optimieren. Dabei hilft anwendungsspezifische LIV-Messtechnik mit hohem Durchsatz. Der Link führt zu einem 4-seitigen Aufsatz zu diesem Thema. Read more...More Product Announcements from Artifex Engineering
3261A Telecom Unit forms the core of a comprehensive component test system. It is configured in conjunction with the Wayne Kerr 3260B Precision Magnetics Analyzer to carry out a wide variety of telecomm related measurements. Read more...More Product Announcements from Wayne Kerr Electronics
The STI Tester provides extensive diagnostics for the Mainframe, Low Current Deck, Pin Programmable Scanner and OVP/Gated OVP adaptor. These self test diagnostics are built into the tester code, and with the supplied self test fixture, can be run at any time Read more...More Product Announcements from Scientific Test, Inc.
Tricor Systems Inc - The Model 555A In-Line Temper Measurement Unit is directly incorporated into a chocolate production line. It continuously monitors the temper of chocolate to ensure product quality and shelf life without requiring operator intervention. The 555A is the first temper measurement system that can be readily installed on existing as well as new... Read more...More Product Announcements from TRICOR Systems Inc.
Discrete Semiconductor Devices Tested From picoamps to 1200 amperes and from millivolts to 2000 volts... Zeners are among those that can be tested with Scientific Test's 5000 series automated semiconductor testers. Read more...More Product Announcements from Scientific Test, Inc.
The Model 5300HX incorporates single test measure techniques to assure a measured value with only one application of stimulus, including tests such as hFE. This minimizes test time, minimizes internal device heating and maximizes throughput. High resolution assures tests like RDSON to an accuracy of ± 0.5 milliohm at 1 A test current. Read more...More Product Announcements from Scientific Test, Inc.
Scientific Test provides high performance semiconductor testers for testing discrete semiconductor devices at prices significantly below our competitors. With our extremely favorable cost-benefit ratio, you can't afford to overlook evaluating how our semiconductor tester can meet or exceed your semiconductor testing requirements at a very affordable cost. Read more...More Product Announcements from Scientific Test, Inc.
Known as the DataBlaster JT 37X7/PXle, this new controller offers support for the increasingly popular PXle/Compact PCI-express slot format that now features in some of the latest Automatic Test Equipment based on the PXI(e) standards. The new boundary-scan controllers satisfies the growing requirements for high-speed In-System Programming (ISP) of flash memories, serial memories and CPLDs Read more...More Product Announcements from JTAG Technologies Inc.