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Supplier: B&K Precision
Description: The Model 570A Analog IC Tester's built-in test library includes all common Analog ICs including op-amps, comparators, voltage regulators, voltage references, analog switches & multiplexes, opto-isolators & couplers, and audio ICs.
- Type / Form Factor: Test Module / Sub-system
- Options / Module Types: Measure Unit / Monitor, Interface / Fixture System
- Components / Products Tested: Active Components / Semiconductors, Audio Equipment, Linear / Mixed Signal (Analog), Passive Components, Power Supplies / Transformers
- Tester / Test Capability: Functional Test (Performance), In-Circuit Tester (ICT)
Description: , and possible equivalents. Both units contain extensive built-in test libraries. The Model 570A Analog IC Tester’s built-in test library includes all common Analog ICs including op-amps, comparators, voltage regulators, voltage references, analog switches & multiplexes, opto-isolators
- Type / Form Factor: Test Module / Sub-system
- Options / Module Types: Measure Unit / Monitor, Interface / Fixture System, Test Software / Program Generator
- Components / Products Tested: Active Components / Semiconductors, Audio Equipment, Linear / Mixed Signal (Analog), MEMS / Sensors, Networking / Communications, Optoelectronics / Fiber Optics, Passive Components, Power Supplies / Transformers
- Tester / Test Capability: Functional Test (Performance), Manufacturing Defect Analyzer (MDA)
Supplier: ProductionLine Testers, Inc.
Description: The IR3000 Model 3 is the latest, fully integrated automatic test system customized to electrically and optically test IrDA transceiver modules. The system has been specifically built and programmed to test 115.2 KHz and 4 Mbps IR transceivers. Tests include standard IC tests, direct LED electrical
Supplier: 1-Source Electronic Components
Description: LOWER PROFILE VCC CONNECTOR For Use With:570A & 575A IC Testers Series:570A Features:CompactLink CD, CompactLink USB security dongle, USB to RS-232 converter, Serial connection cable, Operator?s manual RoHS Compliant: NA
Supplier: Digi-Key Corporation
Description: IC TESTER BIT ERROR RATE 32-TQFP
- Technology: Other
- Device Type / Applications: Other
- Supply Voltage: 5 V
- TJ: 32 to 158 F
Supplier: Carlton-Bates Company
Description: Test Lead Sets: Type - Test Leads Kit; Lead Material - Silicone; Tester Plug - Right-Angle; End Type - Selectable; Accessories - 4 Alligator Clips, 2 Spade Lugs, 4 Test Probes, 2 Flexible Test Leads, 1 Nylon Storage Pouch, 2 IC Test Probe Tip Adapters, 2 Test Lead Couplers, 2 Minipincer Test Clips
- Probe Configuration: Other
Supplier: ValueTronics International, Inc.
Description: Specialized test lead set for B+K Precision semiconductor testers. Three conductor lead with 4mm banana plugs to mini-IC test clips.
- Configuration: Handheld
Supplier: Inspec Inc.
Description: Our temperature and humidity controlled laboratory, houses: CMM's,Portable CMM's, Laser Scanners, Vision Systems, Optical Comparators, Hardness Testers, Roundness Analyzers, Surface Finishers. We also offer programming and inspection services off-site at our customer's facilities.
- Capabilities: Auditing / Assessment, Certification, Consulting / Training, Evaluation, Failure Analysis / Troubleshooting, Field Evaluation / On-site Inspection, First Article / Contract QA, Fixtures / Equipment, In-process / In-line Testing, Research and Development, Specialty / Other
- Forms Inspected: Components / Parts, Products, Facilities / Capital Equipment, Quality / Management Systems, Samples, Services
- Services Offered: Condition Monitoring, Color / Appearance, Dimensional Gaging / Metrology, Electrical / Electronic Testing, NDT / Inspection, Reliability / Robustness, Visual / Video Inspection, Specialty / Other
- Industry Applications: / Laboratory, Marine, Materials, Piping / Pressure Vessels, RF & Wireless / IT & Telecom, Microelectronics / Electronics, Semiconductor / IC Packages, Welding & Fabrication, Specialty / Other
Description: Type: New commercial Calibration: New Warranty: 1 Year Ships in: 8 Weeks Country of Origin:
Description: V-I Test •Analogue Matrix V-I •Digital IC Identifier •EPROM Verifier •Short Locator •TestlFlow Manager Specifications •1x SYSTEM 8 64 channel Board Fault Locator module •1x SYSTEM 8 24 channel Analogue IC Tester module •1x Board Fault Locator cable set
IC Pin Probes - Interface Probes for Test Jet, Polarity Check, GenRad and Teladyne Testers -- 100 SeriesSupplier: QA Technology Company, Inc.
Description: Interface Probes are used in testers for electromechanical contact between the fixture and tester. QA Technology has 100 Series interface probes that are recommended replacements for Agilent Technologies, and Teradyne / Genrad testers.
- Contact / Pin Type: Spring Loaded
- Center Spacing: Gold Plating
- RoHS Compliant: Yes
- Contact Resistance: 0.0120 ohms
Supplier: Coto Technology
Description: . The designer is now able to switch or pass signals with wider bandwidth and faster rise time than alternative technologies. This is particularly important in Mixed Signal IC testers. This four-inone BGA packaging allows relays to be integrated easily on boards designed for surface mount processing.
- Relay Type: Reed Relay
- Mounting: PC Board, Other
- Maximum Current: 0.4000 amps
- Maximum AC Switching Voltage: 125 volts
Supplier: Techwell, Inc.
Description: Key Features Clocking speeds up to 40MHz 15ns tr/tf at 2000pF CLOAD 0.5ns rise and fall times mismatch 0.5ns TON-TOFF prop delay mismatch 3.5pF typical input capacitance 3.5A peak drive Low on resistance of 3.5„¦ High capacitive drive capability Operates from 4.5V up to 16.5V
IC Analog Multiplexers - DG409Single 8-Channel/Differential 4-Channel, CMOS Analog Multiplexers -- DG409Supplier: Techwell, Inc.
Description: Key Features ON Resistance (Max, 25°C) 100„¦ Low Power Consumption (PD) <11mW Fast Switching Action tTRANS <250ns tON/OFF(EN) <150ns Low Charge Injection Upgrade from DG508A/DG509A TTL, CMOS Compatible Single or Split Supply Operation Pb-Free Plus Anneal Available
- Configuration: 4x1
- Supply Voltage (VS): 5 to 34 volts
- COFF: 2.50E-11 F
- ΔRON: 40 ohms
Description: case for easy portability. Includes: Anti-Static Wrist Strap Three Prongs Holder Electronic Tester Brush Knife 6 - Hex Key Bits: 2, 2.5, 3, 4, 5, 6mm 4 - Piece Electronic Combination Wrench Set 8 - Star Bits: T10h, T15h, T20h, T25h, T27h, T30h, T35h, T40h 2 - Phillips Bits: #0, #2 4 - Tri-Wing
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Featured Products for Ic Tester Top
PhotoMOS Optical Isolated MOSFET Relays
capacitance 14pF (typ.). C type. : On resistance 9.5 Ω (typ.). Output capacitance 1.1pF (typ.). Typical applications. Measuring equipment. IC tester, Probe cards, board tester and other testing equipment. Telecommunication or broadcasting equipment . Medical equipment... (read more)
Browse Solid State Relays Datasheets for Panasonic
ROHM Semiconductor USA, LLC
3ch CMOS LDO Regulators
capacitor compatibility. Low circuit current: 120 µA. 3 output voltages (1.5V/1.8V/2.8V). 200mA output current/channel. Compact, low-profile VSON008X2030 package. 10mV load regulation. 2mV line regulation. Multiple protection circuits: thermal shutdown, overcurrent. 1 µA standby current. Built-in output discharge circuit. Applications: GPS. Mobile phones. Digital cameras. Gaming systems. Smart metering. Glucose testers... (read more)
Browse IC Power Supplies Datasheets for ROHM Semiconductor USA, LLC
Parts by Number for Ic Tester Top
|Part #||Distributor||Manufacturer||Product Category||Description|
|IC1||Digi-Key||Greenlee Communications||Test and Measurement||INDUCTIVE COUPLER|
|IC692MAA541||PLC Radwell||General Electric||PLCs/Machine Control, PLC Module & Rack||DRIVE TEST MODULE I/O 120VAC IN 120VAC OUT 120VAC|
|IC692MAA541||PLC Radwell||Fanuc||PLCs/Machine Control, PLC Module & Rack||DRIVE TEST MODULE I/O 120VAC IN 120VAC OUT 120VAC|
|IC692MAA541||PLC Radwell||Ge Fanuc||PLCs/Machine Control, PLC Module & Rack||DRIVE TEST MODULE I/O 120VAC IN 120VAC OUT 120VAC|
|IC692MSC306||PLC Radwell||Fanuc||Not Provided||DRIVE TEST PACKAGE 90-20|
Conduct Research Top
Bellows let chip testers run hot and cold
along the chip track. A spring in the center post of each bellows actuator retracts when air pressure is removed. Developers of an IC tester realized they had a problem when they looked for actuators able to function over the equipment's -76 to 302 F test range. Pneumatic actuators in the S-170
How Triz solved a sticky little IC problem
tester lifts an IC into delicate finger contacts to test the chip. Innovation Workbench led the engineering team to replace the fragile finger contacts with conductive elastomers that would perform the same function. The larger blob in the center is an elastic material that pushes the IC away from
Surface Enhancements Eliminate ESD Damage During Operation of State-of-the-Art I.C. Handlers
When San Jose California's Exatron engineered their latest generation of integrated circuit (I.C.) handling equipment, protection from damage due to electro-static discharge (ESD) was a top priority. So they turned to a company known for pioneering high-tech protective coatings for NASA - General
EETimes.com | Electronics Industry News for EEs & Engineering Managers
Heard on the Beat (May 3) Heard on the Beat (May 3) Semiconductor Alert! (April 28-May 3) Commentary & analysis of week's chip news, April 28-May 3 ATE startup Inovys leaks details about new low-cost IC tester for SoC devices PLEASANTON, Calif. -- More details are surfacing about the first
Reed Relays Carry Out Switching Functions in Performance Boards Used in Integrated Circuits
these testers with each new generation of new chips would represent. Coil Voltage. 5.0. Volts. Max Pull-in Voltage. 3.75 Volts. prohibitive costs. Performance boards have extended the life of the IC testers. Min. Drop-out. 0.85. Volts. for several years and defers those up front capital expenditures
Application: RF Reed Relays Used in Integrated Circuits Performance PCBs
have extended the life of the IC testers. Min. Drop-out. 0.85. Volts. for several years and defers those up front capital expenditures. With each new. Re. R e. e d. e. d Swi. w tic. t h. h. integrated circuit, new performance boards are generated that create the. Ch. C a. h r. a ac. a t. c er. e
EETimes.com | Electronics Industry News for EEs & Engineering Managers
Atmel rolls out single-chip DAB processor for digital radios HEILBRONN, Germany--Atmel Corp. today announced a single-chip baseband processor for Digital Audio Broadcasting (DAB) radios. The European unit of Atmel here said the new IC U2739M processor is the industry's first one-chip decoder
Reducing Parametric Test Costs with Faster, Smarter Parallel Test Techniques
to their test structure designs as they. intercept future mask changes. Parametric test is used primarily during the process development, process integration,. and volume fabrication portions of an IC's lifecycle (shown in Figure 5). Figure 5. Throughout the process ramp, the amount of parametric
More Information on: Ic Tester Top
Digital Logic Testing and Simulation 2nd Edition
When debugging first silicon, the IC tester can apply stimuli and monitor response in order to determine whether or not the device responds correctly.
A reconfigurable digital IC tester implemented using the ARM Integrator rapid prototyping system
A reconfigurable digital IC tester implemented using the ARM Integrator rapid prototyping system .
The Boundary-Scan Handbook
Figure 4-1: The analog testing subsystem of an IC tester is used to switch load and test resources to measure analog parametric properties of an IC.
Bipolar Transistor Tester / Digital IC Tester for Physics Lab
Bipolar Transistor Tester / Digital IC Tester for Physics Lab .
Optical Delay Tester
We place an electro-optic crystal at the back of the IC tester 's test board and irradiate the crystal with laser pulses.
Search results for Digital IC
ICT-6D - Digital IC Tester ICT-6D is a desktop digital IC Tester which helps user diagnose the quality of digital ICs.
Design of a LOW Cost IC Tester
Design of a Low Cost IC Tester .
Microcontroller Based IC Tester
Microcontroller Based IC Tester .