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Parts by Number for Ic Tester Top

Part # Distributor Manufacturer Product Category Description
IC1 Digi-Key Greenlee Communications Test and Measurement INDUCTIVE COUPLER
IC692MAA541 PLC Radwell General Electric PLCs/Machine Control, PLC Module & Rack DRIVE TEST MODULE I/O 120VAC IN 120VAC OUT 120VAC
IC692MAA541 PLC Radwell Fanuc PLCs/Machine Control, PLC Module & Rack DRIVE TEST MODULE I/O 120VAC IN 120VAC OUT 120VAC
IC692MAA541 PLC Radwell Ge Fanuc PLCs/Machine Control, PLC Module & Rack DRIVE TEST MODULE I/O 120VAC IN 120VAC OUT 120VAC
IC692MSC306 PLC Radwell Fanuc Not Provided DRIVE TEST PACKAGE 90-20
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Conduct Research Top

  • Bellows let chip testers run hot and cold
    along the chip track. A spring in the center post of each bellows actuator retracts when air pressure is removed. Developers of an IC tester realized they had a problem when they looked for actuators able to function over the equipment's -76 to 302 F test range. Pneumatic actuators in the S-170
  • How Triz solved a sticky little IC problem
    tester lifts an IC into delicate finger contacts to test the chip. Innovation Workbench led the engineering team to replace the fragile finger contacts with conductive elastomers that would perform the same function. The larger blob in the center is an elastic material that pushes the IC away from
  • Surface Enhancements Eliminate ESD Damage During Operation of State-of-the-Art I.C. Handlers
    When San Jose California's Exatron engineered their latest generation of integrated circuit (I.C.) handling equipment, protection from damage due to electro-static discharge (ESD) was a top priority. So they turned to a company known for pioneering high-tech protective coatings for NASA - General
  • Application: Testing IC's Using Reed Relays
    . • Dielectric strength across the contacts 200. volts. • Contacts dynamically tested. • Surface mounted. • Very low profile. • BGAs available. • Rugged thermoset over-molded packaging. • Qual-shield arrangement. Figure 2. Integrated circuit test board showing IC's and reed relays. Applications. Re. R e
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Heard on the Beat (May 3) Heard on the Beat (May 3) Semiconductor Alert! (April 28-May 3) Commentary & analysis of week's chip news, April 28-May 3 ATE startup Inovys leaks details about new low-cost IC tester for SoC devices PLEASANTON, Calif. -- More details are surfacing about the first
  • Application: RF Reed Relays Used in Integrated Circuits Performance PCBs
    have extended the life of the IC testers. Min. Drop-out. 0.85. Volts. for several years and defers those up front capital expenditures. With each new. Re. R e. e d. e. d Swi. w tic. t h. h. integrated circuit, new performance boards are generated that create the. Ch. C a. h r. a ac. a t. c er. e
  • Reed Relays Carry Out Switching Functions in Performance Boards Used in Integrated Circuits
    these testers with each new generation of new chips would represent. Coil Voltage. 5.0. Volts. Max Pull-in Voltage. 3.75 Volts. prohibitive costs. Performance boards have extended the life of the IC testers. Min. Drop-out. 0.85. Volts. for several years and defers those up front capital expenditures
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Atmel rolls out single-chip DAB processor for digital radios HEILBRONN, Germany--Atmel Corp. today announced a single-chip baseband processor for Digital Audio Broadcasting (DAB) radios. The European unit of Atmel here said the new IC U2739M processor is the industry's first one-chip decoder

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