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  • Glass, Film, and Other Nonconductive Material Measurement with Capacitive Sensors
    the measurement.
  • Material Friction Coefficient and Temperature
    Abstract: This article briefs on the influence of temperature fluctuation on friction coefficient of material. It also analyzes the actual testing requirements on film friction coefficient in actual application. The coefficient of friction is a measurement of frictional force between two surfaces
  • Liquid Material Verification
    Large manufacturing facilities often get truck or railcar loads of different liquid materials. With an InfraSpec VFA-IR Spectrometer, samples can be analyzed at remote locations without having to bring samples to a centralized laboratory and delaying the off-loading of raw material. Problems can
  • Conductive Material Thickness Measurement with Capacitive Sensors
    Details two methods of capacitive, noncontact thickness measurement of a conductive target: Single Channel (Good), and Dual-Channel (Best). The high resolution of capacitive sensors results in accurate, high resolution, noncontact measurement of thickness.
    modulus properties were the measurements used in the initial material screening. The most promising candidate materials for evaluation were selected after a review of the general properties of six different kinds of thermoplastic elastomers: styrene block copolymers, thermoplastic elastomeric
  • Continuous Improvement of Material Characterization Methodology through Gage Repeatability and Reproducibility Studies
    , we present the use of ANOVA-based "Gage R&R" (repeatability and reproducibility) studies as the main analytical tool for the evaluation of our XRD, sheet resistance, and PL measurement processes. The results of early Gage studies for some of the measured material parameters revealed
  • Reflectometer Measurements - Revisited
    . Today while scalars are still used, the Vector Network Analyzer (VNA) has also become common in both engineering and manufacturing environments. Many measurements are made and recorded with little attention given to the actual accuracy of the measurement. This Review will include some of the material
  • MICRO: Critical Material-Wafers
    Karen Woolford, Lee Newfield, and Christopher Panczyk, SUMCO USA A noncontact measurement technique equals or betters the capabilities of current metrologies, while eliminating the need to scrap wafer samples. anufacturers of advanced microprocessors, BiCMOS devices, and state-of-the-art DRAMs look

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