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Welcome to GlobalSpec - a trusted source for engineers and industrial professionals.
Search GlobalSpec to find scanning electron microscopy surveillance-related products, suppliers, datasheets and CAD.
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Product Alerts
Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics) |
...and mechanical testing. Analytical laboratory services may also use various microscopy and metallography techniques and perform nondestructive testing (NDT), property testing, opacity testing, optical emission spectroscopy, scanning electron... Search by Specification | Learn More
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition. Search by Specification | Learn More
Microscopy sample preparation equipment and metallography sample preparation equipment is used for the preparation of samples for metallographic or microscopic inspection and analysis. Learn More
...testing, property testing, rheology, scanning electron microscopy, standards testing or certification, thermal analysis, wet chemical analysis, and X-ray fluorescence. Some material testing services test materials used in aerospace, automotive... Search by Specification | Learn More
...or sieve analysis, property testing, rheology, scanning electron microscopy, standards testing or certification, thermal analysis, wet chemical analysis, and X-ray fluorescence. Some chemical testing services test chemicals that are used... Search by Specification | Learn More
...that transmit light or environmental scanning electron microscopes (SEM). Gemological microscopes use polarized light with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. Tool making specialty... Search by Specification | Learn More
...microscopes, microwave microscopes, fluorescent microscopes, laser or confocal microscopes, polarizing microscopes, portable field microscopes, scanning electron (SEM) microscopes, scanning probe or atomic force microscopes (SPM / AFM), and transmission... Search by Specification | Learn More
...field, scanning electron microscope (SEM), scanning force or atomic probe microscope (SFM/AFM), stereoscopes and transmission electron microscopes. Acoustic and ultrasonic microscopes, compound microscopes, and fluorescent and UV microscopes... Search by Specification | Learn More
...microscopes transmit light or use environmental scanning electron microscopy (SEM). Gemological devices use polarized light with lower magnifying powers to produce sharp, bright images in a wide field of view. Measuring microscopes are used to measure... Search by Specification | Learn More
...other so that the only light that passes through the specimen reaches the eyepiece. Portable field microscopes are lightweight devices that include an energy source such as a battery. Scanning electron microscopy (SPM) forms images with a detector... Search by Specification | Learn More
Web sensing systems and web scanning systems employ a variety of sensors that scan across a moving web to detect defects and measure parameters such as product basis weight, thickness and moisture. Learn More
Environmental testing and analytical services provide testing of environmental samples such as soil, water, air, and industrial wastes or byproducts. Search by Specification | Learn More
Ion beam guns and electron beam guns produce beams of electrons, ions or other particles for use in chemical and surface analysis, particle physics, resin curing or semiconductor manufacturing. Learn More
Scanning software is used with optical and document scanners or with other imaging equipment to digitize, create, edit and evaluate images. Learn More
Surveillance systems are used to monitor property for the presence or behavior of visitors. Learn More
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Scanning Electron Microscopy (SEM) Integrity Testing Laboratory Inc.
Design Improvement Services M&P Lab (The)
Electron Microscopy M&P Lab (The)
Failure Analysis Investigations M&P Lab (The)
Reverse Engineering M&P Lab (The)
Hexavalent Chromium Testing Analytics Corporation
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ITL provides analytical and characterization services using its three scanning electron microscopes that are also equipped with energy dispersive X-ray microanalysis systems. (read more)
The Scanning Electron Microscope (SEM) is one of the most versatile and widely used tools of modern science as it allows the study of both morphology and composition of biological and physical materials. (read more)
The M&P Lab is equipped with a sophisticated state-of-the-art scanning electron microscope (SEM) and an electron microprobe, which provide detailed information on a material's elemental composition, microscopic structure and surface topography. (read more)
Microscopic examination of samples can provide important information for product failure problem solving and product development. (read more)
In this webcast, a Phenom™ expert explains and demonstrates how the Phenom empowers new users to quickly take their own electron microscope images (read more)
The Phenom personal electron microscope brings the sub-micron world within easy reach of teachers and students. (read more)
By combining techniques, manufacturers can conduct fast, nondestructive measurement and analysis functions.
Article by Matt Smith, Olympus Surgical Industrial America Inc. (read more)
FEI's Phenom is the first "Point and Shoot" desktop SEM. High-quality images are possible without specialized operators or facilities while eliminating the expense, delay, and difficulty of conventional SEM. (read more)
The M&P Lab can help you verify that the materials you make or buy comply with your specifications, qualify new lower-cost suppliers, validate changes to your manufacturing processes and more. (read more)
The properties of many engineering materials are governed by a combination of metal composition and the morphology and distribution of key micro-structural features (read more)
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Further Microstructural Characterization of Submerged-Arc Weld... Keywords: Transmission electron microscopy, optical microscopy, scanning electron microscopy, convergent beam diffraction, energy dispersive X-ray See ASTM International Information |
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Oxidation and Deuterium Uptake of Zr-2.5Nb Pressure Tubes in... See ASTM International Information |
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GTRESEARCHNEWS January 26, 2009 The Silent Treatment: Aeroacoustics research on UAVs could lead to stealthier surveillance |
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Identification and quantitive analysis of calcium phosphate... of calcium phosphate microparticles in intestinal tissue by nuclear microscopy Authors: Inmaculada Gomez-Morilla, Vinay Thoree, Jonathan J. Powell, |
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[No Title] Growth Journal of Electromagnetic Waves and Applications Journal of Electron Materials Journal of Electronic Imaging Journal of Electronic Materials See Electronics and Electrical Engineering Laboratory Information |
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MRS Bulletin Web Site |
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Television - Facts from the Encyclopedia - Yahoo! Education industry, e.g., for surveillance in places inaccessible to or dangerous for human beings; in science, e.g., in tissue microscopy (see microscope); |
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ISO 14132-5:2008 - Optics and photonics -- Vocabulary for... ISO 22493:2008 Microbeam analysis -- Scanning electron microscopy -- Vocabulary See International Organization for Standardization (ISO) Information |
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Nanoelectronics - Wikipedia, the free encyclopedia Scanning probe microscopy Atomic force microscope Scanning tunneling microscope |
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Photonics Online: Online Resource For Engineers in the Optics... Super-Resolution 3D Microscopy Uncovers Cellular Interactions With... |
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