Products/Services for Transmission Electron Microscope Cost

Product News

Conduct Research

...destructive measurement force microscope is able to accurately techniques such as cross-section quantify both. The Dimension X3D, scanning electron microscopy (X-SEM) which provides robust data on and transmission electron microscopy materials via the highest sensitivity with (TEM) are labor...

Show More

Revolutionary steels devised with nanotechnology may be poised to usher in a new Iron Age. Transmission electron microscope micrograph showing the changes in the microstructure of nanosteel alloys with varying crystallization conditions. (Left) 500C for 100-hr heat treatment showing anisotropic...

Show More

Minimizing vibration and noise betters image quality in inspection applications. Harrison H. ChinApplied Concept Research Inc. When it comes to high-resolution inspection as in scanning for semiconductor defect review, image stability is paramount. Consider a scanning electron microscope (SEM...

Show More

More Information

Lock Indicates content that may require registration and/or purchase. Powered by IHS Goldfire