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  • 3D Atomic Force Microscopy as an Alternative to X-SEM and TEM for Advanced Process Metrology (AN91) (.pdf)
    , destructive measurement force microscope is able to accurately techniques such as cross-section quantify both. The Dimension X3D, scanning electron microscopy (X-SEM) which provides robust data on and transmission electron microscopy materials via the highest sensitivity with (TEM) are labor
  • MICRO: Archive: Back Issue TOC
    for transmission electron microscopes; patent granted for method of increasing resolution in existing D/A convertors without additional hardware; maskless photolitho system projects master images directly onto substrate materials; supplier receives patent for use of silicon carbide barrier films between
  • Nanostructured Steels Are On The Horizon
    Revolutionary steels devised with nanotechnology may be poised to usher in a new Iron Age. Transmission electron microscope micrograph showing the changes in the microstructure of nanosteel alloys with varying crystallization conditions. (Left) 500C for 100-hr heat treatment showing anisotropic
  • Whole lot of shakin' goin' on
    Minimizing vibration and noise betters image quality in inspection applications. Harrison H. ChinApplied Concept Research Inc. When it comes to high-resolution inspection as in scanning for semiconductor defect review, image stability is paramount. Consider a scanning electron microscope (SEM

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