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...destructive measurement force microscope is able to accurately techniques such as cross-section quantify both. The Dimension X3D, scanning electron microscopy (X-SEM) which provides robust data on and transmission electron microscopy materials via the highest sensitivity with (TEM) are labor...

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Revolutionary steels devised with nanotechnology may be poised to usher in a new Iron Age. Transmission electron microscope micrograph showing the changes in the microstructure of nanosteel alloys with varying crystallization conditions. (Left) 500C for 100-hr heat treatment showing anisotropic...

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Minimizing vibration and noise betters image quality in inspection applications. Harrison H. ChinApplied Concept Research Inc. When it comes to high-resolution inspection as in scanning for semiconductor defect review, image stability is paramount. Consider a scanning electron microscope (SEM...

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