Help with Scanning Probe Microscopes specifications:
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| Application: | |||
| Your choices are... | |||
| Biological / Life Science | Microscopes used for biological or life sciences inspections. These types of microscopes might include those that transmit light or environmental scanning electron microscopes (SEM). | ||
| Gemological | Microscope used for gemological inspection. These microscopes often use polarized light with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. | ||
| Measuring / Toolmaker | Microscopes used by toolmakers for measuring properties of tools. These microscopes are often used for dimensional measurement with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. | ||
| Medical / Forensic | Microscopes used for medical or forensic inspection purposes. These microscopes are often hands-free, binocular microscopes with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. | ||
| Metallurgical | Microscope used for metallurgical inspection. Often metallurgical microscopes are inverted for viewing the bottom of a sample with lower magnifying powers to allow for brighter, sharper images combined with a wide field of view. | ||
| Semiconductor Inspection | Microscopes used to study the layers in a semiconductor wafer or fabricated IC component. This inspection calls for greater precision and throughput. | ||
| Other | Other unlisted, specialized, or proprietary application. | ||
| Search Logic: | All products with ANY of the selected attributes will be returned as matches. Leaving all boxes unchecked will not limit the search criteria for this question; products with all attribute options will be returned as matches. | ||
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| Scanning Probe Microscope Type | |||
| Your choices are... | |||
| AFM | The microscope is an Atomic Force Microscope. | ||
| BEEM | The microscope is a Ballistic Electron Emission Microscope. | ||
| CFM | The microscope is a Chemical Force Microscope. | ||
| C-AFM | The microscope is a Conductive Atomic Force Microscope. | ||
| ECSTM | The microscope is an Electrochemical Scanning Tunneling Microscope. | ||
| EFM | The microscope is an Electrostatic Force Microscope. | ||
| Fluid FM | The microscope is a Fluidic Force Microscope. | ||
| FMM | The microscope is a Force Modulation Microscope. | ||
| FOSPM | The microscope is a Feature-Oriented Scanning Probe Microscope. | ||
| KPFM | The microscope is a Kelvin Probe Force Microscope. | ||
| MFM | The microscope is a Magnetic Force Microscope. | ||
| MRFM | The microscope is a Magnetic Resonance Force Microscope. | ||
| NSOM | The microscope is a Near-Field Scanning Optical Microscope. | ||
| PFM | The microscope is a Piezoresponse Force Microscope. | ||
| PSTM | The microscope is a Photon Scanning Tunneling Microscope. | ||
| PTMS | The microscope is a Photothermal Microspectroscopy Microscope. | ||
| SCM | The microscope is a Scanning Capacitance Microscope. | ||
| SECM | The microscope is a Scanning Electrochemical Microscope. | ||
| SGM | The microscope is a Scanning Gate Microscope. | ||
| SHPM | The microscope is a Scanning Hall Probe Microscope. | ||
| SICM | The microscope is a Scanning Ion-Conductance Microscope. | ||
| SPSM | The microscope is a Spin Polarized Scanning Tunneling Microscope. | ||
| SSRM | The microscope is a Scanning Spreading Resistance Microscope. | ||
| SThM | The microscope is a Scanning Thermal Microscope. | ||
| STM | The microscope is a Scanning Tunneling Microscope. | ||
| STP | The microscope is a Scanning Tunneling Potentiometer Microscope. | ||
| SVM | The microscope is a Scanning Voltage Microscope. | ||
| SXSTM | The microscope is a Synchrotron X-ray Scanning Tunneling Microscope. | ||
| Other | Any other Scanning Probe Microscope type not listed. | ||
| Search Logic: | All products with ANY of the selected attributes will be returned as matches. Leaving all boxes unchecked will not limit the search criteria for this question; products with all attribute options will be returned as matches. | ||
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| Lateral Resolution: | An optical device reveals the fineness of detail in an object. Objectively, resolution is specified as the minimum distance between two lines or points in the object that are perceived as separate by the human eye. Subjectively, the images of the two resolved points must fall on two receptors (rods or cones), which are separated by at least one other receptor on the retina of the eye. | ||
| Search Logic: | All matching products will have a value less than or equal to the specified value. | ||
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