See All Suppliers In This Area
Fill out as many options as you want. Click "Run Search Filter" at any time.

Resolution:

Zoom:

X

Aperture Size:

Measurement:

Optical Configuration:

Light Source / Laser Type:

Laser Wavelength:

Number of Axes:

Orientation:

User Interface / Control:

Display & Special Features:

Operating Temperature:

Allow up to: overrange/margin
Use the overrange/margin to restrict your search to items whose full-scale range is close to your requirements.
(Overrange/margin requires both 'From' and 'To' values to work.)

Help with Interferometers specifications:

Performance Specifications
   Resolution:       Minimum detectable dimensional variations, flatness variations, position, surface roughness, etc. 
   Search Logic:      User may specify either, both, or neither of the "At Least" and "No More Than" values. Products returned as matches will meet all specified criteria.
   Zoom:       Zoom range of the interferometer, usually quoted as 2x, 4x, 7x, etc. 
   Search Logic:      User may specify either, both, or neither of the "At Least" and "No More Than" values. Products returned as matches will meet all specified criteria.
   Aperture Size:       The opening in the interferometer through which light passes. The size of aperture is either fixed or adjustable.  Aperture size can alter focal point or working distance and collimation. 
   Search Logic:      User may specify either, both, or neither of the "At Least" and "No More Than" values. Products returned as matches will meet all specified criteria.
Back to Top
Measurement Capability
   Measurement       
   Your choices are...         
   Aspheric Surfaces       Interferometer is capable of providing measurements of aspheric surfaces.  Aspheric surfaces or lenses are non-spherical. 
   Displacement / Position       The interferometer is designed for measuring displacement and position. Displacement measuring interferometers (DMI) are used to gage and provide feedback on the position of stages, tooling and other components in lithography, optical steppers, laser mask writers, scanners, galvanometers, semiconductor fab equipment, flat panel display manufacturing equipment, probers, die bonders, drilling tools, precision grinding equipment, and high end machine tools. 
   Flatness       Interferometer has the capability to measure flatness of plano elements such as mirrors, prisms and windows. Flatness places all of the points on a part's surface within a single plane. Flatness is often quantified by comparing a part's surface to a reference plane or optical flat. Typically, a least-squares reference or centerline plane is used. The areas above and below the reference plane are equal, and kept to a minimum separation. The highest peak-to-valley normal measurement provides an indication of part flatness. Flatness can also be analyzed with the minimum zone calculation method. The surface data to be analyzed is enclosed by two parallel planes with only minimal separation. The level of flatness or flatness error is then indicated by the amount of separation between the two planes. 
   Parallelism / Wedge       Interferometer is capable of providing measurements of parallelism or wedge. The wavefront reflected from the two surfaces of the optical component produce the interference used to measure deviation from parallelism. 
   Power Spectrum Density (PSD)       Instrument has to the capability to perform power spectrum density or frequency analysis. PSD methods are used to monitor process changes in optical manufacturing such as the effects of tool wear, tool chatter and feed rate. 
   Profiles / Topography       Interferometer measures surface profiles, roughness, waviness and other finish or surface texture parameters through noncontact interferometric methods. 
   Radius of Curvature       Interferometer is capable of providing radius of curvature measurements.  Radius of curvature is the reciprocal of curvature. Radius of curvature indicates the sharpness of a curve on a shape.  A straight line has a curvature equal to 1 and an infinite radius of curvature. A true sphere has a radius of curvature equal to the radius.  A lens can have positive or negative radius of curvature depending on whether the lens is concave or convex. 
   Roundness       Interferometer can measure the roundness of parts or components.  Ideal roundness is the condition in which all parts of a circle are identical or equidistant from the center point or axis. Out-of-roundness is the radial deviation of the actual profile from ideal roundness. Roundness is measured using the minimum radius separation (MRS), least-squares center (LSC) and minimum inscribed circle (MIC) methods. In the MRS method, roundness is measured by assessing the separation of two concentric circles perpendicular to the part’s surface that just contains the measured surface. In the LSC method, a theoretical least-squares circle and center are compared to the actual part surface. In the MIC method, the smallest circle that will just contain the measured profile is constructed, and the profile center of this minimum inscribed circle is determined.  Roundness measurements are used to evaluate and control the quality of shafts, bearings, cylinders or other precision components. Roundness variations or out-of-roundness are measured by determining the maximum inward deviations of the part’s profile from the minimum inscribed circle. 
   Spherical Elements       Interferometer provides quantitative measurements of spherical elements, parts or components.  
   Step Height       Instrument is capable of step-height dimensional measurements of sample features or deposited films. 
   Surface Maps       Interferometer can spatially map the value of a parameter over an area of a part's surface. Some interferometers can provide both front and back surface maps. Surface maps can provide an indication of homogeneity and thickness variations across the surface of the component. Surface mapping is useful in maintaining quality, yield and productivity during in the manufacturing of semiconductor wafers, lenses, flat panel displays, mirrors, optical components or thin film deposits. 
   Thickness       Instrument is capable of dimensional measurements of sample or film thickness. 
   Wavefront       Interferometer can measure the distortion of a plane wave transmitted through an optical lens or component. Wavefront measurements can provide an indication of material homogeneity across the element. 
   Specialty / Other       Instrument can measure or provide other unlisted or custom parameters for a particular industry application. 
   Search Logic:      All products with ANY of the selected attributes will be returned as matches. Leaving all boxes unchecked will not limit the search criteria for this question; products with all attribute options will be returned as matches.
Back to Top
Configuration
   Optical Configuration:       
   Your choices are...         
   Fizeau       An interferometer that incorporates a reference and test light path of unequal distance.  May also be called an image plane interferometer. 
   Fabrey-Perot       Frequency tuning device that exploits the properties of interference between two adjacent flat, parallel surfaces. 
   Michelson       An interferometer constructed using a half-silvered mirror inclined at a 45° angle to the incoming beam. Half the light is reflected perpendicularly and bounces off a beamsplitter; half passes through and is reflected from a second beamsplitter. The light passing through the mirror must also pass through an inclined compensator plate to compensate for the fact that the other ray passes through the mirror glass three times instead of one. 
   Twyman-Green       The beam splitter and mirror arrangement of the Twyman-Green interferometer resembles that of a Michelson interferometer. The difference lies in the way the interferometers are illuminated. While the Michelson interferometer is used with an extended light source, the Twyman-Green interferometer is used with a monochromatic point source, which is located at the principal focus of a well-corrected lens. 
   Other       Other unlisted, specialized, or proprietary interferometer types. 
   Search Logic:      All products with ANY of the selected attributes will be returned as matches. Leaving all boxes unchecked will not limit the search criteria for this question; products with all attribute options will be returned as matches.
   Light Source / Laser Type:       
   Your choices are...         
   CO2       A gas laser that uses a mixture of carbon dioxide, nitrogen (N2), and helium (He) to produce a continuous output of laser light at a wavelength of 10.6 micrometers. 
   Diode Laser       Diode lasers use light-emitting diodes to produce stimulated emissions in the form of coherent light output. They are also known as laser diodes. 
   Fiber Laser       Fiber lasers use optical fibers doped with low levels of rare-earth halides as the lasing medium to amplify light. 
   HeNe       Laser in which the active medium is a mixture of helium and neon, which is in the visible range. Used widely in industry for alignment, recording, printing, and measuring, it is also valuable as a pointer or aligner of invisible CO2 laser light. 
   Ion Laser (e.g., Argon / Krypton)       Ion lasers function by stimulating the emission of radiation between two levels of an ionized gas.  They can provide moderate to high continuous-wave output of typically 1 mW to 10 W. Argon lasers and krypton lasers are common types of ion lasers. 
   Solid State (e.g., Nd-YAG)       Solid state lasers use a transparent substance (crystalline or glass) as the active medium, doped to provide the energy states necessary for lasing.  Solid state lasers are used in both low and high power applications. Laser material choices for solid state lasers include Nd-YAG, ND-YVO,  Nd-YLF, Alexandrite, and Ti doped sapphire. 
   Other       Other unlisted, specialized, or proprietary laser types. 
   Search Logic:      All products with ANY of the selected attributes will be returned as matches. Leaving all boxes unchecked will not limit the search criteria for this question; products with all attribute options will be returned as matches.
   Laser Wavelength:         
   Search Logic:      User may specify either, both, or neither of the "At Least" and "No More Than" values. Products returned as matches will meet all specified criteria.
Back to Top
Features
   Number of Axes       
   Your choices are...         
   Single       The interferometer can measure on only a single axis. 
   Multiple       The interferometer can measure on multiple axes. 
   Search Logic:      All products with ANY of the selected attributes will be returned as matches. Leaving all boxes unchecked will not limit the search criteria for this question; products with all attribute options will be returned as matches.
   Orientation:       
   Your choices are...         
   Horizontal       The interferometer is oriented for horizontal inspection. 
   Vertical       The interferometer is oriented for vertical inspection. 
   Search Logic:      All products with ANY of the selected attributes will be returned as matches. Leaving all boxes unchecked will not limit the search criteria for this question; products with all attribute options will be returned as matches.
   User Interface / Control       
   Your choices are...         
   Analog Control       The instrument has simple front panel or local controls such as knobs and/or potentiometers. 
   Computer Interface       The interferometer can be controlled or monitored remotely with a computer via interface. 
   Digital Interface       Interferometer is controlled through a digital keyboard or keypad interface. 
   Remote Control       The interferometer can be operated by remote control. 
   Search Logic:      All products with ANY of the selected attributes will be returned as matches. Leaving all boxes unchecked will not limit the search criteria for this question; products with all attribute options will be returned as matches.
   Display & Special Features       
   Your choices are...         
   Analog Meter       Data is displayed with an analog meter or simple visual indicator. 
   Continuous Zoom       The interferometer has continuous zoom capabilities. 
   Digital Readout       Device uses numerical or application specific display. 
   Serial / Digital Output       Flow meter output includes signals such as serial, parallel, Ethernet or other digital formats indicating a process variable.  This does not include communication lines, just process measurement. 
   High Resolution Camera       The interferometer has a high-resolution camera for image capture purposes. 
   SPC Software / Capability       Instrument has integral or optional SPC software or analysis capability. 
   Video / Graphic Display       The data is presented in video form via CRT, LCD, or other multi-line forms. 
   Search Logic:      All products with ANY of the selected attributes will be returned as matches. Leaving all boxes unchecked will not limit the search criteria for this question; products with all attribute options will be returned as matches.
   Operating Temperature:       This is the full required range of ambient operating temperature. 
   Search Logic:      User may specify either, both, or neither of the limits in a "From - To" range; when both are specified, matching products will cover entire range. Products returned as matches will meet all specified criteria.
Back to Top