| Electron Optics and Focused Ion Beam Technologies |
| Scanning Electron Microscope (SEM) - For Inspecting Topographies of Materials | | Web Site |
| Transmission Electron Microscope - For Analyzing the Atomic Structure, and Composition of Specimens | | Web Site |
| DualBeam™ Systems - Scanning Electron Microscope and Focused Ion Beam Capabilities Combined | | Web Site |
| Focused Ion Beam (FIB) Tools - For Imaging and at High-Beam Currents for Site-Specific Milling | | Web Site |
| Specialty Tools - Designed and Engineered to Meet Your Specific Needs | | Web Site |
