Veeco Instruments - Product Announcements

The best research instruments not only acquire the intended data, but actually increase productivity. Veeco's new BioScope™ Catalyst™ Atomic Force Microscope (AFM) accelerates innovative research by reducing the time and effort needed to combine the proven techniques of light microscopy with the unique benefits of atomic force microscopy. (read more)

The Dimension® Icon™ Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in polymers, semiconductors, energy, data storage and other materials fields. The latest member of the Dimension family is the culmination of decades of technological innovation, industry-leading application customization, and customer feedback. (read more)

The NEW In-Motion™ Solution: MEMS Package for Wyko® NT9000 Series Optical Profilers enables detailed characterization of MEMS and other micro-devices during operation, including optical switches, micro-mirrors, and accelerometers. (read more)

Incorporating high-performance Nanoscope V controller for semiconductor wafers, lithography masks, magnetic media, CDs/DVDs, biomaterials, optics, and other samples up to 200mm. (read more)

You'll be amazed by the high-resolution, low-noise images from our new Innova AFM. (read more)

Veeco Presents the Next Revolution in AFM - HarmoniX™! (read more)

The preeminent system for high-resolution imaging, high-definition nanolithography, and direct nanoscale manipulation. (read more)

The Dektak 150 Surface Profiler boasts the industry's best performance, best repeatability, and largest standard scanning range for research and production environments. (read more)

Advanced stylus profiler system delivers high repeatability, low-force sensor technology and advanced 3D data analysis for surface characterization of MEMS and thin & thick films. (read more)

Veeco manufactures the world's most complete line of probes and accessories for current and next-generation applications. (read more)

The new bench-top Wyko NT9100 Optical Profiling System shares many of the performance attributes of the larger ninth-generation NT9000 systems, including: easy measurement setup, fast data acquisition, comprehensible and extensible data analysis, and angstrom-level repeatability. (read more)

Veeco's third-generation, large-format surface profiling system provides unprecedented measurement performance and capability on substrate panels, bumped substrates, flat panels, and circuit boards. (read more)

The Wyko NT9300 utilizes Veeco's ninth-generation optical profiling sensor technology to provide fast, highly accurate 3D surface topography measurements from 0.1 nanometer up to 10 millimeters. The extended, large scan capability makes this system ideal for large-region, stitched, and irregular samples. (read more)

The Wyko NT9800 Optical Profiler delivers rapid, non-contact, 3D measurements from 0.1 nanometer up to 10 millimeters, with sub-nanometer resolution. (read more)

AFM with a sealed hermetic sample chamber for control of sample atmosphere and temperature. (read more)

The NEW low-cost, high value Caliber scanning probe microscope (SPM) is the ideal entry level instrument for surface science research. (read more)

Innovative force-measurement features and handheld PicoAngler force-feedback device allows quantified and tactile interpretations of molecular structure. (read more)

The next generation of the world's best-selling, most field-proven SPM, incorporating the high-speed, high-resolution Nanoscope V controller. (read more)

The InSight^TM 3D Atomic Force Microscope (AFM) provides unparalleled accuracy and precision required for non-destructive, high-resolution 3D measurements of critical 45nm and 32nm semiconductor features. (read more)