Go to GlobalSpec.com Home
Toolbar   The Engineering Toolbar
The Ultimate Resource for Engineering and Technical Research. (Learn More)

4Wave, Inc. - Company Profile


Company Profile
   List your products or services on GlobalSpec

Supplier Saved

You have successfully saved 4Wave, Inc. to My Suppliers

Print Print
Business Type Address Contact 4Wave, Inc.
Manufacturer
Service
4Wave, Inc.
22977 Eaglewood Ct, Suite 120
Sterling, VA 20166
USA
Web site
Phone: (703) 787-9283 100

Search other suppliers in the following categories:
Coating equipment is used to apply organic, inorganic or metal coatings onto part surfaces for industrial applications.
Contract manufacturing services provide parts and equipment on behalf of original equipment manufacturers (OEM). The design and brand name remain the property of the OEM. Contract manufacturing may involve a complete range of services from design and prototyping to final production, assembly, and quality assurance for complete products.
Digital decoders and digital demultiplexers move data between inputs and outputs. In the case of digital decoders, the coded information is translated into familiar or uncoded formats, while digital multiplexers transmit data from one input through to several output lines. 
Engineering consulting firms provide engineering services and expertise to companies in need of a specialized skill-set.  Professionals in this category work with clients to define solutions to problems or to help determine and recommend the best course of action for a given initiative.
Research and development services perform original investigation to gain new knowledge (research) and/or apply research findings to create or improve products and processes (development).
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  
Thin film equipment uses vacuum processing for the modification of surfaces using CVD, PVD, plasma etching, and thermal oxidation or ion implantation.
Thin film process monitors are used to control thin film deposition rate or composition during processing.
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.