Lithography equipment transfers circuit or device patterns onto a substrate using a patterned mask and a beam of light or electrons to selectively expose a photoresist layer. Overlay metrology systems align the pattern masks or reticules.
Non-destructive testing (NDT) conductivity meters and resistivity meters are devices for measuring electrical conductivity and/or resistivity of solid media to determine the characteristics of its constituent materials.
Non-destructive testing (NDT) supplies and accessories are used to detect, inspect, and measure flaws, bond integrity, and other material conditions without permanently altering or destroying the examined part or product.
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