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Calibration standards and reference sources include any source that can provide a reference for the calibration of an instrument or comparison of a material or component.
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Digital delay generators are electronic test equipment that generates delays (pulses at precise, programmed intervals) to trigger devices under test.
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Electronic counters and electronic timers are completely electronic units for performing a variety of counter or timer functions.
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Frequency counters are digital indicating meters for accurate measurement and display of square wave and pulse input signals.
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Gas and air instruments detect, monitor or analyze gases present in an environment.
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High voltage power supplies use linear technology to provide one or more DC outputs at voltage levels of hundreds or thousands of volts.
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LCR meters and impedance meters measures inductance (L), capacitance (C), and resistance or impedance (R).
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Mass spectrometers separate ions by their mass-to-charge (m/z) ratios. They are used to identify compounds by the mass of one or more elements in the compound. They are also used to determine the isotopic composition of one or more elements in a compound.
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Power supplies are devices that produce AC or DC power. This grouping includes current sources, DC power supplies, AC-DC adapters, DC-DC converters, AC power sources, and DC-AC inverters.
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Pressure gauges are used for a variety of industrial and application-specific pressure monitoring applications. Uses include visual monitoring of air and gas pressure for compressors, vacuum equipment, process lines and specialty tank applications such as medical gas cylinders and fire extinguishers.
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Pulse generators are electrical test equipment used to generate pulses that are injected into devices under test in order to study the behavior of these devices.
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Residual gas analyzers (Rags) identify the gases present in vacuum environments.
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Scalar network analyzers measure the amplitude portion of scattering or S-parameters, reflection and transmission coefficients between the incident and reflection waves that describe a device’s behavior under linear conditions at the microwave frequency range.
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Signal conditioning products provide amplification, filtering, converting, and other processes required to make sensor output suitable for reading by computer boards.
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Signal generators and waveform generators are used to test and align all types of transmitters and receivers, to measure frequency and to generate a signal, waveform or noise source. Signal generators can use AC energy, audio frequency (AF) and radio frequency (RF) to function.
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Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available.
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Spectrum analyzers and signal analyzers display raw, unprocessed signal information such as voltage, power, period, wave shape, sidebands, and frequency. They can provide the user with a clear and precise window into the frequency spectrum.
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Temperature indicators and temperature instruments are designed for temperature monitoring and analysis. These devices either come equipped with an integral sensor, or require sensor input.
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Temperature instruments use contact or noncontact methods to measure temperature. Products include dial, digital, industrial and laboratory thermometers; temperature probes, indicators, and sensors; RTD elements and transmitters; and thermistors, thermocouples, thermopiles, and thermal switches.
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Thermocouple elements are temperature sensors that are useful over a wide range of temperatures. Thermocouples are formed by two dissimilar metals.
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Thin film process monitors are used to control thin film deposition rate or composition during processing.
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Vector network analyzers are instruments that measure the complex transmission and reflection characteristics of two-port devices in the frequency domain.
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Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
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