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Search other suppliers in the following categories:
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Capacitive linear position sensors are devices that sense position / displacement using capacitance technology.
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Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore.
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Linear position sensors is a general search form for all linear position / displacement detection product areas.
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Magnetic field instruments include meters, gauges, recorders and other instrumentation for the measurement of magnetic fields and/or magnetic flux.
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Magnetometers are scientific instruments that measure the strength and/or direction of a magnetic field. There are two basic types: scalar and vector.
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Non-destructive testing (NDT) supplies and accessories are used to detect, inspect, and measure flaws, bond integrity, and other material conditions without permanently altering or destroying the examined part or product.
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Position probes measure the position of a target surface, usually with a high degree of accuracy. This search form covers many different linear position products.
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Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness and defects.
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Surface profilometers are contact or non-contact instruments used to measures surface profiles, roughness, waviness and other finish parameters.
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Thickness gages are used to make precise dimensional measurements on a wide variety of coatings and materials including steel, plastic, glass, rubber, ceramics, paint, electroplated layers, enamels, etc
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Vibration instruments are used for measuring, displaying and analyzing vibration. Typically these instruments comprise a transducer, data acquisition and either a local display or some sort of output to a computer or another instrument.
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Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
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